Abstract: A method to validate data used in a design of a semiconductor product currently in a partially fabricated state is disclosed. The partially fabricated state having a plurality of layers up to and including a first conductive layer. The method generally includes the steps of (A) adding a second conductive layer from a user specification to an application set, the application set having a plurality of resources that define the semiconductor product, (B) validating a new resource in the user specification against the resources in the application set, (C) adding the new resource to the application set upon passing the validating and (D) propagating the new resource throughout a description of the semiconductor product, the description being stored in a computer-readable medium.

Abstract: A method to validate data used in a design of a semiconductor product currently in a partially fabricated state is disclosed. The partially fabricated state having a plurality of layers up to and including a first conductive layer. The method generally includes the steps of (A) adding a second conductive layer from a user specification to an application set, the application set having a plurality of resources that define the semiconductor product, (B) validating a new resource in the user specification against the resources in the application set, (C) adding the new resource to the application set upon passing the validating and (D) propagating the new resource throughout a description of the semiconductor product, the description being stored in a computer-readable medium.

Abstract: A method to validate data used in a design of a semiconductor product. The method includes (a) reading resources of an application set defining the semiconductor product in a partially fabricated state comprising fabrication layers up to and including a lowest conductive layer (b) reading a user specification that (i) is developed based upon the application set at the partially fabricated state and (ii) establishes at least one upper conductive layer added to the application set that completes the design of the semiconductor product, (c) allocating a new resource from the user specification to the design of the semiconductor product, said new resource having multiple parameters, (d) validating the allocation of the new resource against the resources of the application set and (e) propagating the allocation of the new resource and the parameters throughout a description of the semiconductor product.