Patents by Inventor Scott W. Blake

Scott W. Blake has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10255671
    Abstract: Methods and systems for efficient inspection that provide a record and enable remote inspection. The system of these teachings includes a source of electromagnetic radiation, a first aiming subsystem optically operatively disposed to receive the electromagnetic radiation from the source of electromagnetic radiation, the first aiming subsystem optically aiming the electromagnetic radiation onto a surface on which an object is disposed, an image acquisition component, a second aiming subsystem optically operatively disposed such that the second aiming subsystem aims an optical field of the image acquisition component to locations on the surface on which the object is disposed, and a computing component configured to establish the object, the first aiming subsystem and the second aiming subsystem in a common coordinate system, wherein the optical field of the image acquisition is aimed at regions illuminated by the electromagnetic radiation.
    Type: Grant
    Filed: March 30, 2016
    Date of Patent: April 9, 2019
    Assignee: ASSEMBLY GUIDANCE SYSTEMS, INC.
    Inventors: Matthew Zmijewski, Scott W. Blake, Eric Eisack, Robert Luoma
  • Patent number: 6304680
    Abstract: A method and system for monitoring a process which determines a location of a product in three dimensional space with respect to a process monitoring system. This is accomplished by generating a rotation and translation transform which enables the process monitoring system to define the location of the product placed in a field of view of the process monitoring system, applying the transform to three dimensional CAD data defining the process being performed with respect to the product to provide transformed CAD data representative of three dimensional information in a two dimensional pattern of the process with respect to the process monitoring system. Utilizing the above, a determination is made whether the two dimensional pattern of the process is present within a range of acceptable images of the process performed with respect to the product. If the product is processed properly the two dimensional pattern of the process is present within the range of acceptable images.
    Type: Grant
    Filed: October 22, 1998
    Date of Patent: October 16, 2001
    Assignee: Assembly Guidance Systems, Inc.
    Inventors: Scott W. Blake, Frederick S. Fenning, Ilya Lapshin