Abstract: It is described herein an improved cryogenic storage unit. The improved cryogenic storage unit may include an apparatus for thermal regulation in a cryogenic freezer. The improved cryogenic storage unit may also include a cable gland. The improved cryogenic storage unit may also include a bearing assembly. The improved cryogenic storage unit may also include a system for charging a cryogen to a cryogenic freezer. The improved cryogenic storage unit may also include a venting system. The improved cryogenic storage unit may also include an alignment of a lid and a handle.

Abstract: An automated sample registration system for registering samples disposed in sample containers or tubes, the system including: a sample container infeed store station having a holding location with a store array configured for storing the containers therein; a sample imager station, with a machine vision system having at least one of a line scanner and a camera, at least one of the line scanner and the camera being configured to generate a machine readable image of each container transported from the array with a transport device automatic grip, the container being held in the grip substantially continuously from container pick, at the store array, throughout imaging of the container by the machine vision system; wherein the grip holds the sample container substantially coincident, at least in part, with imaging of the container by the machine vision system so that generating the machine readable image is effected in one grip step.

Abstract: It is described herein an improved cryogenic storage unit. The improved cryogenic storage unit may include an apparatus for thermal regulation in a cryogenic freezer. The improved cryogenic storage unit may also include a cable gland. The improved cryogenic storage unit may also include a bearing assembly. The improved cryogenic storage unit may also include a system for charging a cryogen to a cryogenic freezer. The improved cryogenic storage unit may also include a venting system. The improved cryogenic storage unit may also include an alignment of a lid and a handle.

Abstract: It is described herein an improved cryogenic storage unit (100). The improved cryogenic storage unit (100) may include an apparatus (1000) for thermal regulation in a cryogenic freezer (100). The improved cryogenic storage unit (100) may also include a cable gland (2000). The improved cryogenic storage unit (100) may also include a bearing assembly (3000). The improved cryogenic storage unit (100) may also include a system (4000) for charging a cryogen to a cryogenic freezer (100). The improved cryogenic storage unit (100) may also include a venting system (5000). The improved cryogenic storage unit (100) may also include an alignment of a lid (5300) and a handle (6000).

Abstract: It is described herein an improved cryogenic storage unit (100). The improved cryogenic storage unit (100) may include an apparatus (1000) for thermal regulation in a cryogenic freezer (100). The improved cryogenic storage unit (100) may also include a cable gland (2000). The improved cryogenic storage unit (100) may also include a bearing assembly (3000). The improved cryogenic storage unit (100) may also include a system (4000) for charging a cryogen to a cryogenic freezer (100). The improved cryogenic storage unit (100) may also include a venting system (5000). The improved cryogenic storage unit (100) may also include an alignment of a lid (5300) and a handle (6000).

Abstract: A scanning probe microscope and methodology called resonant difference-frequency atomic force ultrasonic microscopy (RDF-AFUM), employs an ultrasonic wave launched from the bottom of a sample while the cantilever of an atomic force microscope, driven at a frequency differing from the ultrasonic frequency by one of the contact resonance frequencies of the cantilever, engages the sample top surface. The nonlinear mixing of the oscillating cantilever and the ultrasonic wave in the region defined by the cantilever tip-sample surface interaction force generates difference-frequency oscillations at the cantilever contact resonance. The resonance-enhanced difference-frequency signals are used to create images of nanoscale near-surface and subsurface features.