Patents by Inventor Sean Michael Hand

Sean Michael Hand has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • High speed atomic force profilometry of large areas
    Patent number: 11668730
    Abstract: An apparatus and method of operating an atomic force profiler (AFP), such as an AFM, using a feedforward control signal in subsequent scan lines of a large area sample to achieve large throughput advantages in, for example, automated applications.
    Type: Grant
    Filed: April 6, 2021
    Date of Patent: June 6, 2023
    Assignee: Bruker Nano, Inc.
    Inventors: Jason Osborne, Vladimir Fonoberov, Sean Michael Hand
  • High Speed Atomic Force Profilometry of Large Areas
    Publication number: 20210341513
    Abstract: An apparatus and method of operating an atomic force profiler (AFP), such as an AFM, using a feedforward control signal in subsequent scan lines of a large area sample to achieve large throughput advantages in, for example, automated applications.
    Type: Application
    Filed: April 6, 2021
    Publication date: November 4, 2021
    Inventors: Jason OSBORNE, Vladimir FONOBEROV, Sean Michael HAND
  • High speed atomic force profilometry of large areas
    Patent number: 10969406
    Abstract: An apparatus and method of operating an atomic force profiler (AFP), such as an AFM, using a feedforward control signal in subsequent scan lines of a large area sample to achieve large throughput advantages in, for example, automated applications.
    Type: Grant
    Filed: August 12, 2019
    Date of Patent: April 6, 2021
    Assignee: Bruker Nano, Inc.
    Inventors: Jason Osborne, Vladimir Fonoberov, Sean Michael Hand
  • High Speed Atomic Force Profilometry of Large Areas
    Publication number: 20200049734
    Abstract: An apparatus and method of operating an atomic force profiler (AFP), such as an AFM, using a feedforward control signal in subsequent scan lines of a large area sample to achieve large throughput advantages in, for example, automated applications.
    Type: Application
    Filed: August 12, 2019
    Publication date: February 13, 2020
    Inventors: Jason Osborne, Vladimir Fonoberov, Sean Michael Hand