Patents by Inventor Seaung Suk Lee
Seaung Suk Lee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 8174879Abstract: A biosensor and a sensing cell array using a biosensor are disclosed. Adjacent materials containing a plurality of different ingredients are analyzed to determine the ingredients based on their magnetic susceptibility or dielectric constant. A sensing cell array includes such as a magnetization pair detection sensor including a MTJ (Magnetic Tunnel Junction) or GMR (Giant Magnetoresistive) device, a magnetoresistive sensor including a MTJ device and a magnetic material (current line), a dielectric constant sensor including a sensing capacitor and a switching device, a magnetization hole detection sensor including a MTJ or GMR device, a current line, a free ferromagnetic layer and a switching device, and a giant magnetoresistive sensor including a GMR device, a switching device and a magnetic material (or forcing wordline).Type: GrantFiled: October 26, 2009Date of Patent: May 8, 2012Assignee: Hynix Semiconductor Inc.Inventors: Hee Bok Kang, Dong Yun Jeong, Jae Hyoung Lim, Young Jin Park, Kye Nam Lee, In Woo Jang, Seaung Suk Lee, Chang Shuk Kim
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Publication number: 20100103720Abstract: A biosensor and a sensing cell array using a biosensor are disclosed. Adjacent materials containing plurality of different ingredients are analyzed to determine the ingredients based on their magnetic susceptibility or dielectric constant. A sensing cell array includes such as a magnetization pair detection sensor including a MTJ (Magnetic Tunnel Junction) or GMR to (Giant Magnetoresistive) device, a magnetoresistive sensor including a MTJ device and a magnetic material (current line), a dielectric constant sensor including a sensing capacitor and a switching device, a magnetization hole detection sensor including a MTJ or GMR device, a current line, a free ferromagnetic layer and a switching device, and a giant magnetoresistive sensor including a GMR device, a switching device and a magnetic material (or forcing wordline).Type: ApplicationFiled: October 26, 2009Publication date: April 29, 2010Applicant: Hynix Semiconductor Inc.Inventors: Hee Bok KANG, Dong Yun Jeong, Jae Hyoung Lim, Young Jin Park, Kye Nam Lee, In Woo Jang, Seaung Suk Lee, Chang Shuk Kim
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Patent number: 7609547Abstract: A biosensor and a sensing cell array using a biosensor are disclosed. Adjacent materials containing a plurality of different ingredients are analyzed to determine the ingredients based on their magnetic susceptibility or dielectric constant. A sensing cell array includes such as a magnetization pair detection sensor including a MTJ (Magnetic Tunnel Junction) or GMR (Giant Magnetoresistive) device, a magnetoresistive sensor including a MTJ device and a magnetic material (current line), a dielectric constant sensor including a sensing capacitor and a switching device, a magnetization hole detection sensor including a MTJ or GMR device, a current line, a free ferromagnetic layer and a switching device, and a giant magnetoresistive sensor including a GMR device, a switching device and a magnetic material (or forcing wordline).Type: GrantFiled: December 21, 2007Date of Patent: October 27, 2009Assignee: Hynix Semiconductor Inc.Inventors: Hee Bok Kang, Dong Yun Jeong, Jae Hyoung Lim, Young Jin Park, Kye Nam Lee, In Woo Jang, Seaung Suk Lee, Chang Shuk Kim
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Patent number: 7333361Abstract: A biosensor and a sensing cell array using a biosensor are disclosed. Adjacent materials containing a plurality of different ingredients are analyzed to determine the ingredients based on their magnetic susceptibility or dielectric constant. A sensing cell array includes such as a magnetization pair detection sensor including a MTJ (Magnetic Tunnel Junction) or GMR (Giant Magnetoresistive) device, a magnetoresistive sensor including a MTJ device and a magnetic material (current line), a dielectric constant sensor including a sensing capacitor and a switching device, a magnetization hole detection sensor including a MTJ or GMR device, a current line, a free ferromagnetic layer and a switching device, and a giant magnetoresistive sensor including a GMR device, a switching device and a magnetic material (or forcing wordline).Type: GrantFiled: February 21, 2006Date of Patent: February 19, 2008Assignee: Hynix Semiconductor Inc.Inventors: Hee Bok Kang, Dong Yun Jeong, Jae Hyoung Lim, Young Jin Park, Kye Nam Lee, In Woo Jang, Seaung Suk Lee, Chang Shuk Kim
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Patent number: 7031186Abstract: A biosensor and a sensing cell array using a biosensor are disclosed. Adjacent materials containing a plurality of different ingredients are analyzed to determine the ingredients based on their magnetic susceptibility or dielectric constant. A sensing cell array includes such as a magnetization pair detection sensor including a MTJ (Magnetic Tunnel Junction) or GMR (Giant Magnetoresistive) device, a magnetoresistive sensor including a MTJ device and a magnetic material (current line), a dielectric constant sensor including a sensing capacitor and a switching device, a magnetization hole detection sensor including a MTJ or GMR device, a current line, a free ferromagnetic layer and a switching device, and a giant magnetoresistive sensor including a GMR device, a switching device and a magnetic material (or forcing wordline).Type: GrantFiled: August 29, 2003Date of Patent: April 18, 2006Assignee: Hynix Semiconductor Inc.Inventors: Hee Bok Kang, Dong Yun Jeong, Jae Hyoung Lim, Young Jin Park, Kye Nam Lee, In Woo Jang, Seaung Suk Lee, Chang Shuk Kim
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Patent number: 6849466Abstract: A method for fabricating a MTJ cell of a magnetic random access memory (MRAM) using a semiconductor film as a tunnel barrier layer is disclosed. The method comprises the steps of: forming a pinned ferromagnetic layer on a connection layer; forming a tunnel barrier layer using a semiconductor film on the pinned ferromagnetic layer; and forming a free ferromagnetic layer on the tunnel barrier layer.Type: GrantFiled: June 30, 2003Date of Patent: February 1, 2005Assignee: Hynix Semiconductor Inc.Inventor: Seaung Suk Lee
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Publication number: 20040120185Abstract: A biosensor and a sensing cell array using a biosensor are disclosed. Adjacent materials containing a plurality of different ingredients are analyzed to determine the ingredients based on their magnetic susceptibility or dielectric constant. A sensing cell array includes such as a magnetization pair detection sensor including a MTJ (Magnetic Tunnel Junction) or GMR (Giant Magnetoresistive) device, a magnetoresistive sensor including a MTJ device and a magnetic material (current line), a dielectric constant sensor including a sensing capacitor and a switching device, a magnetization hole detection sensor including a MTJ or GMR device, a current line, a free ferromagnetic layer and a switching device, and a giant magnetoresistive sensor including a GMR device, a switching device and a magnetic material (or forcing wordline).Type: ApplicationFiled: August 29, 2003Publication date: June 24, 2004Inventors: Hee Bok Kang, Dong Yun Jeong, Jae Hyoung Lim, Young Jin Park, Kye Nam Lee, In Woo Jang, Seaung Suk Lee, Chang Shuk Kim
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Publication number: 20040014246Abstract: A method for fabricating a MTJ cell of a magnetic random access memory (MRAM) using a semiconductor film as a tunnel barrier layer is disclosed. The method comprises the steps of: forming a pinned ferromagnetic layer on a connection layer; forming a tunnel barrier layer using a semiconductor film on the pinned ferromagnetic layer; and forming a free ferromagnetic layer on the tunnel barrier layer.Type: ApplicationFiled: June 30, 2003Publication date: January 22, 2004Inventor: Seaung Suk Lee
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Patent number: 6642100Abstract: A semiconductor device for use in a memory cell including an active matrix provided with a transistor and a first insulating layer formed around the transistor; a capacitor structure, formed on top of the first insulating layer and composed of a bottom electrode, a capacitor thin film placed on top of the bottom electrode and a top electrode formed on top of the capacitor thin film; a second insulating layer formed on top of the transistor and the capacitor structure; a metal interconnection formed on top of the second insulating layer and the active matrix to electrically connect the transistor to the capacitor structure; and a hydrogen barrier layer formed on top of the metal interconnection, wherein the hydrogen barrier layer is made of an aluminum oxide (AlxOy) layer.Type: GrantFiled: June 28, 2001Date of Patent: November 4, 2003Assignee: Hyundai Electronics Industries Co., Ltd.Inventors: Bee-Lyong Yang, Seaung-Suk Lee, Suk-Kyoung Hong, Nam-Soo Kang
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Publication number: 20030173677Abstract: A semiconductor device for use in a memory cell including an active matrix provided with a transistor and a first insulating layer formed around the transistor; a capacitor structure, formed on top of the first insulating layer and composed of a bottom electrode, a capacitor thin film placed on top of the bottom electrode and a top electrode formed on top of the capacitor thin film; a second insulating layer formed on top of the transistor and the capacitor structure; a metal interconnection formed on top of the second insulating layer and the active matrix to electrically connect the transistor to the capacitor structure; and a hydrogen barrier layer formed on top of the metal interconnection, wherein the hydrogen barrier layer is made of an aluminum oxide (AlxOy) layer.Type: ApplicationFiled: April 14, 2003Publication date: September 18, 2003Applicant: Hyundai Electronics Industries Co., Ltd.Inventors: Bee-Lyong Yang, Seaung-Suk Lee, Suk-Kyoung Hong, Nam-Soo Kang
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Publication number: 20030006443Abstract: A semiconductor device for use in a memory cell including an active matrix provided with a transistor and a first insulating layer formed around the transistor; a capacitor structure, formed on top of the first insulating layer and composed of a bottom electrode, a capacitor thin film placed on top of the bottom electrode and a top electrode formed on top of the capacitor thin film; a second insulating layer formed on top of the transistor and the capacitor structure; a metal interconnection formed on top of the second insulating layer and the active matrix to electrically connect the transistor to the capacitor structure; and a hydrogen barrier layer formed on top of the metal interconnection, wherein the hydrogen barrier layer is made of an aluminum oxide (AlxOy) layer.Type: ApplicationFiled: March 20, 2002Publication date: January 9, 2003Applicant: Hyundai Electronics Industries Co., Ltd.Inventors: Bee-Lyong Yang, Seaung-Suk Lee, Suk-Kyoung Hong, Nam-Soo Kang
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Patent number: 6423554Abstract: A semiconductor device for use in a memory cell including an active matrix provided with a transistor and a first insulating layer formed around the transistor; a capacitor structure formed on top of the first insulating layer, composed of a bottom electrode, a capacitor thin film placed on top of the bottom electrode and a top electrode formed on top of the capacitor thin film; a second insulating layer formed on top of the transistor and the capacitor structure; a metal interconnection formed on top of the second insulating layer and the active matrix to electrically connect the transistor to the capacitor structure; and a hydrogen barrier layer formed on top of the metal interconnection.Type: GrantFiled: December 19, 2000Date of Patent: July 23, 2002Assignee: Hyundai Electronics Industries Co., Ltd.Inventors: Bee-Lyong Yang, Seaung-Suk Lee, Suk-Kyoung Hong, Nam-Soo Kang
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Publication number: 20020020868Abstract: A semiconductor device for use in a memory cell including an active matrix provided with a transistor and a first insulating layer formed around the transistor; a capacitor structure, formed on top of the first insulating layer and composed of a bottom electrode, a capacitor thin film placed on top of the bottom electrode and a top electrode formed on top of the capacitor thin film; a second insulating layer formed on top of the transistor and the capacitor structure; a metal interconnection formed on top of the second insulating layer and the active matrix to electrically connect the transistor to the capacitor structure; and a hydrogen barrier layer formed on top of the metal interconnection, wherein the hydrogen barrier layer is made of an aluminum oxide (AlxOy) layer.Type: ApplicationFiled: June 28, 2001Publication date: February 21, 2002Inventors: Bee-Lyong Yang, Seaung-Suk Lee, Suk-Kyoung Hong, Nam-Soo Kang
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Publication number: 20010006239Abstract: A semiconductor device for use in a memory cell including an active matrix provided with a transistor and a first insulating layer formed around the transistor; a capacitor structure formed on top of the first insulating layer, composed of a bottom electrode, a capacitor thin film placed on top of the bottom electrode and a top electrode formed on top of the capacitor thin film; a second insulating layer formed on top of the transistor and the capacitor structure; a metal interconnection formed on top of the second insulating layer and the active matrix to electrically connect the transistor to the capacitor structure; and a hydrogen barrier layer formed on top of the metal interconnection.Type: ApplicationFiled: December 19, 2000Publication date: July 5, 2001Inventors: Bee-Lyong Yang, Seaung-Suk Lee, Suk-Kyoung Hong, Nam-Soo Kang
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Patent number: 5985757Abstract: A method for fabricating highly integrated semiconductor devices with capacitors having a dielectric film comprised of a thin film exhibiting a high dielectric constant to obtain a sufficient capacitance, involving the formation of an under electrode over a wafer formed with an oxide film at a high temperature, and annealing the resulting wafer in a vacuum such that the under electrode has a tight and smooth structure. By virtue of the tight and smooth structure of the under electrode, subsequent processing steps can be easily carried out. It is also possible to achieve an improvement in the reliability and uniformity of semiconductor devices as well as a high integration of such semicoductor devices.Type: GrantFiled: April 5, 1996Date of Patent: November 16, 1999Assignee: Hyundai Electronics Industries Co., Ltd.Inventors: Won Jae Lee, Seaung Suk Lee, Ho G. Kim, Jong Choul Kim
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Patent number: 5827571Abstract: The present invention is to provide a method for forming ferroelectric films using a hot-wall chemical vapor deposition apparatus, comprising the steps of: heating the processing tube and a plurality of receptacles which contain ferroelectric source materials; loading wafers into said processing tube; conveying vaporized gases from said receptacles to a mixing chamber using carrier gas when said processing is set to a predetermined temperature and mixing said vaporized gases in said mixing chamber, by keeping said processing tube vacuum; providing said mixing chamber with oxidization gas and reaction speed control gas to control reaction speed in said processing tube; and injecting mixed gases in said mixing chamber into said processing tube through a gas injecting means and depositing said mixed gases in said mixing chamber on the wafers.Type: GrantFiled: September 17, 1997Date of Patent: October 27, 1998Assignee: Hyundai Electronics Industries Co., Ltd.Inventors: Seaung Suk Lee, Ho Gi Kim, Jong Choul Kim, Soo Han Choi