Patents by Inventor Sebastian Butefisch

Sebastian Butefisch has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Touch probe with deflection measurement and inspection optics
    Patent number: 6789327
    Abstract: A touch probe 9 for a coordinate measuring apparatus is proposed which includes a touch probe chassis 29 adapted to be attached to the coordinate measuring apparatus, a support for the sensing stylus 39 which is mounted on the touch probe chassis 29 so as to be deflectable from a rest position and on which a sensing stylus 47 is mountable for contacting a workpiece 17, a deflection measuring system 55, 57 for detecting a deflection of the support for the sensing stylus 39 with respect to the touch probe chassis 29 and an inspection optics 61 for inspecting a tip 49 of the sensing stylus 47. The touch probe 1 is characterized in that at least one of the components support for the sensing stylus 39 and touch probe chassis 29 comprises a transverse support 39 which extends transversely to a direction of extension of the sensing stylus 47 and which is transparent to light in at least a portion thereof and which is disposed in a beam path 69 of the inspection optics 61.
    Type: Grant
    Filed: August 22, 2003
    Date of Patent: September 14, 2004
    Assignee: Carl Zeiss Industrielle Messtechnik GmbH
    Inventors: Roland Roth, Karl Seitz, Kurt Brenner, Uwe Brand, Wolfgang Hoffmann, Thomas Kleine-Besten, Sebastian Bütefisch, Stephanus Büttgenbach
  • Coordinate measuring apparatus for contacting a workpiece, touch probe for a coordinate measuring apparatus and method of operating a coordinate measuring apparatus
    Publication number: 20040118000
    Abstract: A touch probe 9 for a coordinate measuring apparatus is proposed which includes a touch probe chassis 29 adapted to be attached to the coordinate measuring apparatus, a support for the sensing stylus 39 which is mounted on the touch probe chassis 29 so as to be deflectable from a rest position and on which a sensing stylus 47 is mountable for contacting a workpiece 17, a deflection measuring system 55, 57 for detecting a deflection of the support for the sensing stylus 39 with respect to the touch probe chassis 29 and an inspection optics 61 for inspecting a tip 49 of the sensing stylus 47. The touch probe 1 is characterized in that at least one of the components support for the sensing stylus 39 and touch probe chassis 29 comprises a transverse support 39 which extends transversely to a direction of extension of the sensing stylus 47 and which is transparent to light in at least a portion thereof and which is disposed in a beam path 69 of the inspection optics 61.
    Type: Application
    Filed: August 22, 2003
    Publication date: June 24, 2004
    Inventors: Roland Roth, Karl Seitz, Kurt Brenner, Uwe Brand, Wolfgang Hoffmann, Thomas Kleine-Besten, Sebastian Butefisch, Stephanus Buttgenbach