Patents by Inventor Sebastian Hiller

Sebastian Hiller has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10094892
    Abstract: Described are methods and apparatus, referred to as “temperature-lock,” which can control and stabilize the sample temperature in an NMR spectrometer, in some instances with a precision and an accuracy of below about 0.1 K. In conventional setups, sample heating caused by experiments with high-power radio frequency pulses is not readily detected and is corrected by a cumbersome manual procedure. In contrast, the temperature-lock disclosed herein automatically maintains the sample at the same reference temperature over the course of different NMR experiments. The temperature-lock can work by continuous or non-continuous measurement of the resonance frequency of a suitable temperature-lock nucleus and simultaneous adaptation of a temperature control signal to stabilize the sample at a reference temperature value. Inter-scan periods with variable length can be used to maintain the sample at thermal equilibrium over the full length of an experiment.
    Type: Grant
    Filed: December 5, 2014
    Date of Patent: October 9, 2018
    Assignee: President and Fellows of Harvard College
    Inventors: Sebastian Hiller, Gerhard Wagner
  • Patent number: 9927483
    Abstract: The temperature calibration characteristic curve of a semiconductor component can be readily determined by interconnecting the power connections of the semiconductor component with a first current source for a load current, a second current source for a measurement current and a voltmeter for measuring the voltage drop across the power connections. Furthermore, the semiconductor component is connected to a data processing system and heated by the dissipated power at time intervals when the first current source is connected, and the voltage drop across the power or auxiliary connections is measured when the first current source disconnected and the second current source is connected between the intervals after a time duration determined by the thermal main time constant of the semiconductor component. The temperature of the semiconductor component is separately measured and the temperature calibration characteristic curve is obtained by correlating the measured temperature with the voltage drop.
    Type: Grant
    Filed: March 16, 2013
    Date of Patent: March 27, 2018
    Assignee: SIEMENS AKTIENGESELLSCHAFT
    Inventors: Marco Bohlländer, Christian Herold, Sebastian Hiller
  • Publication number: 20150212169
    Abstract: Described are methods and apparatus, referred to as “temperature-lock,” which can control and stabilize the sample temperature in an NMR spectrometer, in some instances with a precision and an accuracy of below about 0.1 K. In conventional setups, sample heating caused by experiments with high-power radio frequency pulses is not readily detected and is corrected by a cumbersome manual procedure. In contrast, the temperature-lock disclosed herein automatically maintains the sample at the same reference temperature over the course of different NMR experiments. The temperature-lock can work by continuous or non-continuous measurement of the resonance frequency of a suitable temperature-lock nucleus and simultaneous adaptation of a temperature control signal to stabilize the sample at a reference temperature value. Inter-scan periods with variable length can be used to maintain the sample at thermal equilibrium over the full length of an experiment.
    Type: Application
    Filed: December 5, 2014
    Publication date: July 30, 2015
    Applicant: President and Fellows of Harvard College
    Inventors: Sebastian Hiller, Gerhard Wagner
  • Publication number: 20150032404
    Abstract: The invention relates to methods and devices for determining the temperature calibration characteristic curve of a semiconductor component (3) appertaining to power electronics. They are distinguished, in particular, by the fact that the temperature calibration characteristic curve can be determined in a simple and economically advantageous manner. For this purpose, the power connections of the semiconductor component (3) are interconnected—with a first current source (1) for a load current,—with a second current source (2) for a measurement Current—with a voltmeter (v) for measuring the voltage dropped across either the power connections or auxiliary connections connected to the power connections.
    Type: Application
    Filed: March 16, 2013
    Publication date: January 29, 2015
    Applicant: Siemens Aktiengesellschaft
    Inventors: Marco Bohlländer, Christian Herold, Sebastian Hiller
  • Patent number: 8941382
    Abstract: Described are methods and apparatus, referred to as “temperature-lock,” which can control and stabilize the sample temperature in an NMR spectrometer, in some instances with a precision and an accuracy of below about 0.1 K. In conventional setups, sample heating caused by experiments with high-power radio frequency pulses is not readily detected and is corrected by a cumbersome manual procedure. In contrast, the temperature-lock disclosed herein automatically maintains the sample at the same reference temperature over the course of different NMR experiments. The temperature-lock can work by continuous or non-continuous measurement of the resonance frequency of a suitable temperature-lock nucleus and simultaneous adaptation of a temperature control signal to stabilize the sample at a reference temperature value. Inter-scan periods with variable length can be used to maintain the sample at thermal equilibrium over the full length of an experiment.
    Type: Grant
    Filed: February 12, 2010
    Date of Patent: January 27, 2015
    Assignee: President and Fellows of Harvard College
    Inventors: Sebastian Hiller, Gerhard Wagner
  • Publication number: 20120119738
    Abstract: Described are methods and apparatus, referred to as “temperature-lock,” which can control and stabilize the sample temperature in an NMR spectrometer, in some instances with a precision and an accuracy of below about 0.1 K. In conventional setups, sample heating caused by experiments with high-power radio frequency pulses is not readily detected and is corrected by a cumbersome manual procedure. In contrast, the temperature-lock disclosed herein automatically maintains the sample at the same reference temperature over the course of different NMR experiments. The temperature- lock can work by continuous or non-continuous measurement of the resonance frequency of a suitable temperature-lock nucleus and simultaneous adaptation of a temperature control signal to stabilize the sample at a reference temperature value. Inter-scan periods with variable length can be used to maintain the sample at thermal equilibrium over the full length of an experiment.
    Type: Application
    Filed: February 12, 2010
    Publication date: May 17, 2012
    Applicant: President and Fellows of Harvard College
    Inventors: Sebastian Hiller, Gerhard Wagner
  • Patent number: 7308365
    Abstract: A method of projection spectroscopy for N-dimensional NMR experiments with the following steps. Data recording through; a) selection of N-dimensional NMR experiments out of a group of N-dimensional experiments, selection of the dimensionalities (Di) of the projections and unconstrained selection of j sets of projection angles, with j?2; b) recording of discrete sets of j projections from the N-dimensional NMR experiments at the selected projection angles; c) peak picking and creating a peak list for each of the j projection spectra is characterized by d) automated identification of peaks in the projection spectra that arise from the same resonance in the N-dimensional spectrum (N?3) using vector algebra to exploit geometrical properties of projections in the N-dimensional space, and computation of a N-dimensional peak list using vector algebra to exploit geometrical properties of projections in the N-dimensional space.
    Type: Grant
    Filed: May 24, 2006
    Date of Patent: December 11, 2007
    Inventors: Francesco Fiorito, Sebastian Hiller, Gerhard Wider, Kurt Wüthrich
  • Publication number: 20060273797
    Abstract: A method of projection spectroscopy for N-dimensional NMR experiments with the following steps. Data recording comprising: a) selection of N-dimensional NMR experiments out of a group of N-dimensional experiments, selection of the dimensionalities (Di) of the projections and unconstrained selection of j sets of projection angles, with j?2; b) recording of discrete sets of j projections from the N-dimensional NMR experiments at the selected projection angles; c) peak picking and creating a peak list for each of the j projection spectra is characterized by d) automated identification of peaks in the projection spectra that arise from the same resonance in the N-dimensional spectrum (N?3) using vector algebra to exploit geometrical properties of projections in the N-dimensional space, and computation of a N-dimensional peak list using vector algebra to exploit geometrical properties of projections in the N-dimensional space.
    Type: Application
    Filed: May 24, 2006
    Publication date: December 7, 2006
    Applicant: Bruker BioSpin AG
    Inventors: Francesco Fiorito, Sebastian Hiller, Gerhard Wider, Kurt Wuthrich