Patents by Inventor Sebastian Jackisch

Sebastian Jackisch has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Interferometric Layer Thickness Determination
    Publication number: 20090296099
    Abstract: An interferometric measuring device for measuring layer thicknesses of partially transparent layers on substrates, especially of wear protection layers based on carbon, having a scanning device which scans these layers automatically in its depth direction, using which an interference plane is displaceable relative to the layer structure, having an interferometer part that has a white light interferometer and/or a wavelength-scanning interferometer. Also described is a corresponding evaluation method.
    Type: Application
    Filed: August 2, 2006
    Publication date: December 3, 2009
    Inventors: Kurt Burger, Thomas Beck, Hartmut Spennemann, Stefan Grosse, Bernd Schmidtke, Ulrich Kallmann, Sebastian Jackisch
  • Interferometic Measuring Device
    Publication number: 20090219515
    Abstract: An interferometric measuring device for measuring layer structure of a plurality of layers has: a scanning apparatus for displacing an interference plane relative to the layer structure; an interferometer part having a wavelength scanning interferometer; an image recorder recording the interfering radiation returning from a reference arm on an object arm, and producing electrical signals as output; and a downstream evaluation device for making available the measuring results.
    Type: Application
    Filed: September 4, 2006
    Publication date: September 3, 2009
    Inventors: Hartmut Spennemann, Bernd Schmidtke, Ulrich Kallmann, Sebastian Jackisch