Abstract: An electronic instrument is described. The electronic instrument includes a transmitter circuit, wherein the transmitter circuit is configured to transmit a test signal to a device under test. The electronic instrument further includes a receiver circuit, wherein the receiver circuit is configured to receive an output signal from the device under test. The electronic instrument further includes a processing circuit, wherein the processing circuit is configured to determine at least one signal quality indicator based on the output signal received from the device under test. The at least one signal quality indicator is indicative of a signal quality of the output signal. Further, a signal analysis method of analyzing a signal received from a device under test is described.

Abstract: The present disclosure provides a main measurement device for simultaneously measuring signals with at least one secondary measurement device, the main measurement device comprising a reference signal output port configured to couple to the at least one secondary measurement device, a reference signal generator coupled to the reference signal output port and configured to generate a reference signal, a measurement port configured to receive a signal to be measured, a trigger output port configured to couple to a trigger input port of the at least one secondary measurement device and to output a trigger signal, and a controllably switchable internal signal path configured to selectively couple the reference signal generator with the measurement port. Further, the present invention discloses a respective secondary measurement device, a respective measurement system, and a respective method.

Abstract: The present disclosure provides a main measurement device for simultaneously measuring signals with at least one secondary measurement device, the main measurement device comprising a reference signal output port configured to couple to the at least one secondary measurement device, a reference signal generator coupled to the reference signal output port and configured to generate a reference signal, a measurement port configured to receive a signal to be measured, a trigger output port configured to couple to a trigger input port of the at least one secondary measurement device and to output a trigger signal, and a controllably switchable internal signal path configured to selectively couple the reference signal generator with the measurement port. Further, the present invention discloses a respective secondary measurement device, a respective measurement system, and a respective method.

Abstract: The present invention relates to a test system for testing a device under test, comprising a signal generating unit being connectable to an input node of the device under test and being adapted to generate a test signal to be applied to the input node of the device under test, wherein the test signal comprises a plurality of frequency peaks at different frequencies. A receiving unit is connectable to an output node of the device under test and is adapted to receive a response signal from the device under test in response to the test signal. An analyzing unit for analyzing the device under test is adapted to determine at least one of a gain value and a phase value based on the test signal generated by the signal generating unit and the response signal received by the receiving unit.

Abstract: The present invention relates to a test system for testing a device under test, comprising a signal generating unit being connectable to an input node of the device under test and being adapted to generate a test signal to be applied to the input node of the device under test, wherein the test signal comprises a plurality of frequency peaks at different frequencies. A receiving unit is connectable to an output node of the device under test and is adapted to receive a response signal from the device under test in response to the test signal. An analyzing unit for analyzing the device under test is adapted to determine at least one of a gain value and a phase value based on the test signal generated by the signal generating unit and the response signal received by the receiving unit.