Patents by Inventor Sebastian Standop

Sebastian Standop has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10724998
    Abstract: A method and system for inspecting a rail profile include using ultrasonic phased arrays. Determined anomalies, such as material flaws like volumetric defects and cracks, in a fluid-immersed rail profile are detected by employing one or more phased array probes located proximate the rail profile. Electronic delays and beam steering and focusing can be employed to tailor the inspection to the rail geometry.
    Type: Grant
    Filed: January 17, 2018
    Date of Patent: July 28, 2020
    Assignee: GE GLOBAL SOURCING LLC
    Inventors: Sebastian Standop, Prashanth Kumar Chinta, Guenter Fuchs, Stephan Falter
  • Publication number: 20190369058
    Abstract: Systems and methods for monitoring the condition of ultrasonic transducers and ultrasonic probes used in non-destructive testing are provided. In one aspect, a degree of deterioration and end of life of an ultrasonic transducer can be estimated based upon measured environmental and/or operating parameters of the ultrasonic transducer. In another aspect, testing parameters acquired by a single ultrasonic probe or different ultrasonic probes can be measured and analyzed to identify deterioration of an ultrasonic probe.
    Type: Application
    Filed: June 3, 2019
    Publication date: December 5, 2019
    Inventors: Alexander Fiseni, Stephan Schmitz, Christof Breidenbach, Stephan Falter, Daniel Koers, Marek Parusel, Lars Rohpeter, Sven Runte, Sebastian Standop
  • Publication number: 20180202977
    Abstract: A method and system for inspecting a rail profile include using ultrasonic phased arrays. Determined anomalies, such as material flaws like volumetric defects and cracks, in a fluid-immersed rail profile are detected by employing one or more phased array probes located proximate the rail profile. Electronic delays and beam steering and focusing can be employed to tailor the inspection to the rail geometry.
    Type: Application
    Filed: January 17, 2018
    Publication date: July 19, 2018
    Inventors: Sebastian Standop, Prashanth Kumar Chinta, Guenter Fuchs, Stephan Falter