Abstract: An apparatus for linearizing an input signal includes a memory, in which an output value is stored for each of a plurality of linearization points. The linearization points divide a value range into a plurality of intervals. Each interval is delimited by a first linearization point with an assigned first output value and a second linearization point with an assigned second output value. The apparatus includes a computer device configured to determine the interval in which an input signal value of the input signal is located and to calculate a linearized output signal value for the input signal value by way of a linear interpolation using the input signal value, the first output value of this interval, and the second output value of this interval. At least two of the intervals have different interval lengths, which are formed by multiplication of an output interval length by an integer factor.

Abstract: An apparatus for linearizing an input signal includes a memory, in which an output value is stored for each of a plurality of linearization points. The linearization points divide a value range into a plurality of intervals. Each interval is delimited by a first linearization point with an assigned first output value and a second linearization point with an assigned second output value. The apparatus includes a computer device configured to determine the interval in which an input signal value of the input signal is located and to calculate a linearized output signal value for the input signal value by way of a linear interpolation using the input signal value, the first output value of this interval, and the second output value of this interval. At least two of the intervals have different interval lengths, which are formed by multiplication of an output interval length by an integer factor.

Abstract: In accordance with an embodiment of the present invention, a method of controlling current through a transistor includes measuring a voltage across the transistor, measuring a current through the transistor, determining a safe operating current for the measured voltage across the transistor, and adjusting a voltage of a control node of the transistor using a feedback controller until the measured current through the transistor is not greater than the determined safe operating current.

Abstract: In accordance with an embodiment of the present invention, a method of controlling current through a transistor includes measuring a voltage across the transistor, measuring a current through the transistor, determining a safe operating current for the measured voltage across the transistor, and adjusting a voltage of a control node of the transistor using a feedback controller until the measured current through the transistor is not greater than the determined safe operating current.