Patents by Inventor Sebastiano Serpico

Sebastiano Serpico has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method of crater detection and registration using marked point processes, multiple birth and death methods and region-based analysis
    Patent number: 11308625
    Abstract: The present invention relates to a novel method and system for crater detection in planetary data based on marked point processes (MPP), effective for various object detection tasks in Earth observation, and for planetary image registration. The resulting spatial features are exploited for registration, together with fitness functions based on the MPP energy, on the mean directed Hausdorff distance, and on the mutual information. Two different methods—one based on birth-death processes and region-of-interest analysis, and the other based on graph cuts and decimated wavelets—are included within the present framework. Experimental results confirmed the effectiveness of the present invention in terms of crater detection performance and sub-pixel registration accuracy.
    Type: Grant
    Filed: September 28, 2020
    Date of Patent: April 19, 2022
    Assignee: United States of America as represented by the Administrator of NASA
    Inventors: Jacqueline J. Le Moigne-Stewart, David Solarna, Gabriele Moser, Sebastiano Serpico
  • System and method of crater detection and registration using marked point processes, multiple birth and death methods and region-based analysis
    Patent number: 10825182
    Abstract: The present invention relates to a novel method and system for crater detection in planetary data based on marked point processes (MPP), effective for various object detection tasks in Earth observation, and for planetary image registration. The resulting spatial features are exploited for registration, together with fitness functions based on the MPP energy, on the mean directed Hausdorff distance, and on the mutual information. Two different methods—one based on birth-death processes and region-of-interest analysis, and the other based on graph cuts and decimated wavelets—are included within the present framework. Experimental results confirmed the effectiveness of the present invention in terms of crater detection performance and sub-pixel registration accuracy.
    Type: Grant
    Filed: September 12, 2018
    Date of Patent: November 3, 2020
    Assignee: United States of America as represented by the Administrator of NASA
    Inventors: Jacqueline J. Le Moigne-Stewart, David Solarna, Gabriele Moser, Sebastiano Serpico, Alberto Gotelli