Abstract: A probe for non-intrusively detecting imperfections in a test object made from metallic, non-conductive, and/or composite materials. The probe may include a capacitive measuring apparatus that includes at least two coplanar electrodes, an adjustment device to adjust a spatial separation between the electrodes, and a separation device. The separation device may maintain a substantially constant distance between the at least two coplanar electrodes and the test object during test measurements.

Abstract: A probe for non-intrusively detecting imperfections in a test object made from metallic, non-conductive, and/or composite materials. The probe may include a capacitive measuring apparatus that includes at least two coplanar electrodes, an adjustment device to adjust a spatial separation between the electrodes, and a separation device. The separation device may maintain a substantially constant distance between the at least two coplanar electrodes and the test object during test measurements.

Abstract: A probe for non-intrusively detecting imperfections in a test object made from metallic, non-conductive, and/or composite materials. The probe may include a capacitive measuring apparatus that includes at least two coplanar electrodes, an adjustment device to adjust a spatial separation between the electrodes, and a separation device. The separation device may maintain a substantially constant distance between the at least two coplanar electrodes and the test object during test measurements.

Abstract: A method for non-intrusively detecting imperfections in a test object made from metallic, non-conductive, and/or composite materials. The method uses a database with predetermined reference values and a probe that comprises a capacitive measuring apparatus with at least two coplanar electrodes. The method includes the operations of placing the at least two coplanar electrodes into a first position that is at a predetermined distance from the test object, performing a capacitive measurement to determine an effective dielectric constant, retrieving a reference value of the predetermined reference values from the database based on the test object and the predetermined distance, and detecting imperfections in the test object based on a comparison of the effective dielectric constant with the reference value.

Abstract: A probe for non-intrusively detecting imperfections in a test object made from metallic, non-conductive, and/or composite materials. The probe may include a capacitive measuring apparatus that includes at least two coplanar electrodes, an adjustment device to adjust a spatial separation between the electrodes, and a separation device. The separation device may maintain a substantially constant distance between the at least two coplanar electrodes and the test object during test measurements.

Abstract: A method for non-intrusively detecting imperfections in a test object made from metallic, non-conductive, and/or composite materials. The method uses a database with predetermined reference values and a probe that comprises a capacitive measuring apparatus with at least two coplanar electrodes. The method includes the operations of placing the at least two coplanar electrodes into a first position that is at a predetermined distance from the test object, performing a capacitive measurement to determine an effective dielectric constant, retrieving a reference value of the predetermined reference values from the database based on the test object and the predetermined distance, and detecting imperfections in the test object based on a comparison of the effective dielectric constant with the reference value.

Abstract: A system and method for inspecting a part to be monitored that is arranged inside a mechanical member, said part to be monitored including a plane wall and a curved wall presenting an angle between them. The system comprises a probe endoscope (20) carrying a head (30), said head (30) presenting a plane face (31) that is suitable for being pressed against said plane wall, said head (30) having an ultrasound probe (35) and at least one magnet (36) flush with said plane face (31), said head (30) having a curved face (32) that is perpendicular to the plane face (31) and that matches the shape of the curved wall of the part to be monitored, the plane face (31) and the curved face (32) forming an L-shaped structure that is suitable for being held against the part to be monitored via each magnet (36), while allowing said part to be monitored to rotate relative to said head (30).

Abstract: A system and method for inspecting a part to be monitored that is arranged inside a mechanical member, said part to be monitored including a plane wall and a curved wall presenting an angle between them. The system comprises a probe endoscope (20) carrying a head (30), said head (30) presenting a plane face (31) that is suitable for being pressed against said plane wall, said head (30) having an ultrasound probe (35) and at least one magnet (36) flush with said plane face (31), said head (30) having a curved face (32) that is perpendicular to the plane face (31) and that matches the shape of the curved wall of the part to be monitored, the plane face (31) and the curved face (32) forming an L-shaped structure that is suitable for being held against the part to be monitored via each magnet (36), while allowing said part to be monitored to rotate relative to said head (30).