Patents by Inventor SEBASTIEN DUCHENNE

SEBASTIEN DUCHENNE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Selecting a survey setting for characterizing a target structure
    Patent number: 9146330
    Abstract: Complex-valued sensitivity data structures corresponding to respective candidate survey settings are provided, where the sensitivity data structures relate measurement data associated with a target structure to at least one parameter of a model of the target structure. Based on the sensitivity data structures, a subset of the candidate survey settings is selected according to a criterion for enhancing resolution in characterizing the target structure.
    Type: Grant
    Filed: March 15, 2012
    Date of Patent: September 29, 2015
    Assignee: WesternGeco L.L.C.
    Inventors: Hugues A. Djikpesse, Michael David Prange, Mohamed-Rabigh Khodja, Sebastien Duchenne, Henry Menkiti
  • SELECTING A SURVEY SETTING FOR CHARACTERIZING A TARGET STRUCTURE
    Publication number: 20120250455
    Abstract: Complex-valued sensitivity data structures corresponding to respective candidate survey settings are provided, where the sensitivity data structures relate measurement data associated with a target structure to at least one parameter of a model of the target structure. Based on the sensitivity data structures, a subset of the candidate survey settings is selected according to a criterion for enhancing resolution in characterizing the target structure.
    Type: Application
    Filed: March 15, 2012
    Publication date: October 4, 2012
    Inventors: HUGUES A. DJIKPESSE, MICHAEL DAVID PRANGE, MOHAMED-RABIGH KHODJA, SEBASTIEN DUCHENNE, HENRY MENKITI