Patents by Inventor Sebastien Gilbert

Sebastien Gilbert has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12249041
    Abstract: Described are techniques for oblique image rectification. The techniques include receiving an original image depicting an oblique view of a circular object and pre-processing the original image into an edge image. The techniques further include generating, by a machine learning model based on the edge image, a heatmap including an ellipse formed by the oblique view of the circular object. The techniques further include computing ellipse parameters describing the ellipse of the heatmap. The techniques further include performing, using the ellipse parameters, an affine transformation on the original image to generate a rectified image, where the rectified image converts the ellipse to a circle.
    Type: Grant
    Filed: October 24, 2022
    Date of Patent: March 11, 2025
    Assignee: International Business Machines Corporation
    Inventors: Sebastien Gilbert, Michele Merler, Dhiraj Joshi, Apurv Gupta, Shyama Prosad Chowdhury, Chidansh Amitkumar Bhatt, Nirmit V. Desai
  • Publication number: 20240428550
    Abstract: A computer-implemented method includes receiving an image of an article of interest to be evaluated relative to one or more features of interest, identifying a reference feature of a known size in the received image, identifying two or more extremities of the reference feature in the received image and a number of pixels between the two or more extremities of the reference feature, calculating a pixel size for the selected image based on the reference feature size and the number of pixels between the two or more extremities of the reference feature, annotating the received image to include one or more tolerance lines for the one or more features of interest, and determining whether the one or more features of interest in the image comply with the one or more tolerance lines. A computer program product and computer system corresponding to the method are also disclosed.
    Type: Application
    Filed: June 20, 2023
    Publication date: December 26, 2024
    Inventors: ROGELIO FERNANDO GUTIERREZ VALDES, Sebastien Gilbert, Ryan Paske, CARLOS EDUARDO JIMENEZ PELAYO
  • Publication number: 20240419948
    Abstract: A system may allocate, in response to receiving an input tensor of a predetermined shape, a portion of convolution kernels to a predetermined number of spatial frequency bands; replace the convolution layer in a convolutional neural network with a sequence of band splitting, parallel convolutions, and concatenation; and form, in response to completing stages for the predetermined number of spatial frequency bands, a final output tensor.
    Type: Application
    Filed: June 19, 2023
    Publication date: December 19, 2024
    Inventor: Sebastien Gilbert
  • Publication number: 20240233067
    Abstract: Described are techniques for oblique image rectification. The techniques include receiving an original image depicting an oblique view of a circular object and pre-processing the original image into an edge image. The techniques further include generating, by a machine learning model based on the edge image, a heatmap including an ellipse formed by the oblique view of the circular object. The techniques further include computing ellipse parameters describing the ellipse of the heatmap. The techniques further include performing, using the ellipse parameters, an affine transformation on the original image to generate a rectified image, where the rectified image converts the ellipse to a circle.
    Type: Application
    Filed: October 24, 2022
    Publication date: July 11, 2024
    Inventors: Sebastien Gilbert, Michele Merler, Dhiraj Joshi, Apurv Gupta, Shyama Prosad Chowdhury, CHIDANSH AMITKUMAR BHATT, Nirmit V. Desai
  • Publication number: 20240135486
    Abstract: Described are techniques for oblique image rectification. The techniques include receiving an original image depicting an oblique view of a circular object and pre-processing the original image into an edge image. The techniques further include generating, by a machine learning model based on the edge image, a heatmap including an ellipse formed by the oblique view of the circular object. The techniques further include computing ellipse parameters describing the ellipse of the heatmap. The techniques further include performing, using the ellipse parameters, an affine transformation on the original image to generate a rectified image, where the rectified image converts the ellipse to a circle.
    Type: Application
    Filed: October 23, 2022
    Publication date: April 25, 2024
    Inventors: Sebastien Gilbert, Michele Merler, Dhiraj Joshi, Apurv Gupta, Shyama Prosad Chowdhury, CHIDANSH AMITKUMAR BHATT, Nirmit V. Desai
  • Publication number: 20240112444
    Abstract: Automated analog gauge reading is provided. The method comprises a computer system receiving input of an image and detecting at least one analog gauge in the image. The computer system corrects the orientation of the analog gauge in the image and detects scene text and tick labels on the analog gauge. The computer system determines a position of a pointer on the analog gauge relative to the scene text and outputs a gauge reading value based on an arithmetic progression of tick labels and angle of the pointer with respect to minimum and maximum values on the analog gauge.
    Type: Application
    Filed: September 29, 2022
    Publication date: April 4, 2024
    Inventors: Michele Merler, Dhiraj Joshi, Apurv Gupta, Sebastien Gilbert, Shyama Prosad Chowdhury, Chidansh Amitkumar Bhatt, Nirmit V. Desai
  • Patent number: 11423577
    Abstract: A method comprises obtaining a plurality of 2-dimensional gray scale images of a portion of a printed circuit board assembly. Each 2-dimensional gray scale image corresponds to one of a plurality of parallel planes intersecting the portion of the printed circuit board assembly at respective different locations. The method further comprises converting the plurality of 2-dimensional gray scale images into a color image. Each of the plurality of 2-dimensional gray scale images corresponds to and is used as input for a respective color channel of the color image. The method further comprises analyzing the color image to detect variation in color that indicates a defect; and outputting an alert indicating the defect in response to detecting the variation in color.
    Type: Grant
    Filed: July 8, 2020
    Date of Patent: August 23, 2022
    Assignee: International Business Machines Corporation
    Inventors: Matthew S. Kelly, Sebastien Gilbert, Oswaldo Chacon
  • Publication number: 20220012917
    Abstract: A method comprises obtaining a plurality of 2-dimensional gray scale images of a portion of a printed circuit board assembly. Each 2-dimensional gray scale image corresponds to one of a plurality of parallel planes intersecting the portion of the printed circuit board assembly at respective different locations. The method further comprises converting the plurality of 2-dimensional gray scale images into a color image. Each of the plurality of 2-dimensional gray scale images corresponds to and is used as input for a respective color channel of the color image. The method further comprises analyzing the color image to detect variation in color that indicates a defect; and outputting an alert indicating the defect in response to detecting the variation in color.
    Type: Application
    Filed: July 8, 2020
    Publication date: January 13, 2022
    Inventors: Matthew S. Kelly, Sebastien Gilbert, Oswaldo Chacon
  • Publication number: 20030081879
    Abstract: A method and apparatus for fabricating Mach-Zehnder interferometers. The first coupler in the interferometer is fabricated using known techniques and the coupling coefficient for the first coupler is measured. By plotting the envelope of the global coupling coefficient function, a function that is dependent solely on the coupling coefficients of the first and the second coupler, the coupling coefficient of the second coupler can be directly obtained.
    Type: Application
    Filed: November 1, 2001
    Publication date: May 1, 2003
    Inventor: Sebastien Gilbert