Patents by Inventor Seck June Foo

Seck June Foo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of and apparatus for testing an integrated circuit package
    Patent number: 6531865
    Abstract: A test circuit for and method of testing integrated circuit packages can be utilized to determine the existence of one or more short circuits between adjacent connectors. The system includes an interface configured to electrically connect the conductors of the integrated circuit package. The interface groups the conductors into a plurality of nodes. The number of nodes is no more than one-half the number of conductors. A control circuit is coupled to the interface. The control circuit determines the existence of one or more short circuits between adjacent conductors in response to signals on the nodes.
    Type: Grant
    Filed: December 19, 2000
    Date of Patent: March 11, 2003
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Zhihong Mai, Seok Hiong Tan, Seck June Foo