Abstract: A method for self-calibration of reference voltage drop in a Digital to Analog Converter (DAC) includes measuring each one of a plurality of thermometric weightages associated with a respective one of a plurality of thermometric bits, wherein the DAC includes a plurality of sub-binary bits and the plurality of thermometric bits. For each sequentially increasing combination of thermometric bit settings including at least two thermometric bits coupled to a high reference voltage and each sub-binary bit coupled to a low reference voltage, performing the steps of: determining a respective combined weightage correction; adding the combined weightage correction to the highest order bit of the combination of thermometric bit settings; and incrementing a number of bits of the combination of thermometric bit settings in response to the number of bits of the sequential combination being less than a total number of the plurality of thermometric bits.

Abstract: A method for self-calibration of reference voltage drop in a Digital to Analog Converter (DAC) includes measuring each one of a plurality of thermometric weightages associated with a respective one of a plurality of thermometric bits, wherein the DAC includes a plurality of sub-binary bits and the plurality of thermometric bits. For each sequentially increasing combination of thermometric bit settings including at least two thermometric bits coupled to a high reference voltage and each sub-binary bit coupled to a low reference voltage, performing the steps of: determining a respective combined weightage correction; adding the combined weightage correction to the highest order bit of the combination of thermometric bit settings; and incrementing a number of bits of the combination of thermometric bit settings in response to the number of bits of the sequential combination being less than a total number of the plurality of thermometric bits.

Abstract: One example discloses a reconfigurable analog to digital converter (ADC) device, including: an analog front end (AFE) configured to receive a set of analog input signals and generate a corresponding set of digital output signals; wherein the AFE includes a set of reconfigurable ADC conversion circuits; and a sequencer coupled to the AFE and configured to control the set of reconfigurable ADC conversion circuits with a first AFE channel configuration at a first time and a second AFE channel configuration at a second time.

Abstract: One example discloses a reconfigurable analog to digital converter (ADC) device, including: an analog front end (AFE) configured to receive a set of analog input signals and generate a corresponding set of digital output signals; wherein the AFE includes a set of reconfigurable ADC conversion circuits; and a sequencer coupled to the AFE and configured to control the set of reconfigurable ADC conversion circuits with a first AFE channel configuration at a first time and a second AFE channel configuration at a second time.