Abstract: A liquid crystal display and a fabricating method thereof for improving an aperture ratio are disclosed. A liquid crystal display (LCD) according to the present invention includes a gate line, a data line and a common line on the thin film transistor array substrate, the gate line crossing the data line to define a pixel region; a thin film transistor near the crossing of the gate line and the data line; a common electrode connected to the common line in the pixel region; and a pixel electrode connected to the thin film transistor in the pixel area for forming an in-plane electric field in association with the common electrode during an operation of the LCD, wherein an edge of the pixel electrode overlaps the common line with at least one insulating layer therebetween, and an edge of the common electrode overlaps the pixel electrode with said at least one insulating layer therebetween.

Abstract: A transflective LCD device includes first and second transparent substrates spaced apart from each other and having a reflective portion and a transmissive portion, an insulator on the first transparent substrate, a passivation layer on the insulator within the reflective portion, a reflector on the passivation layer, a transparent pixel electrode disposed over the insulator covering the reflector and the passivation layer, a buffer pattern disposed on a rear surface of the second substrate, the buffer pattern having a saw-tooth shape corresponding to the reflective portion, a color filter on the rear surface of the second substrate covering the buffer pattern, the color filter having a first thickness in the transmissive portion and a second thickness in the reflective portion, a transparent common electrode on a rear surface of the color filter, and a liquid crystal layer between the transparent pixel electrode and the transparent common electrode.

Abstract: A liquid crystal display and a fabricating method thereof for improving an aperture ratio are disclosed. A liquid crystal display (LCD) according to the present invention includes a gate line, a data line and a common line on the thin film transistor array substrate, the gate line crossing the data line to define a pixel region; a thin film transistor near the crossing of the gate line and the data line; a common electrode connected to the common line in the pixel region; and a pixel electrode connected to the thin film transistor in the pixel area for forming an in-plane electric field in association with the common electrode during an operation of the LCD, wherein an edge of the pixel electrode overlaps the common line with at least one insulating layer therebetween, and an edge of the common electrode overlaps the pixel electrode with said at least one insulating layer therebetween.

Abstract: A method for fabrication a substrate for a liquid crystal display device includes: forming a color filter layer on a substrate; coating an organic layer on the color filter layer; irradiating a first light onto the organic layer; irradiating a second light onto the organic layer through a mask having a transmitting portion and a shielding portion, an energy density of the first light smaller than an energy density of the second light; and forming an overcoat layer and a column spacer by developing the organic layer.

Abstract: A method and apparatus for testing a liquid crystal display device are provided to detect a defect location precisely and rapidly without requiring a jig. The method includes providing an inspection apparatus as a removable portion of the liquid crystal display device; inspecting the display part of the liquid crystal display device using the inspection apparatus; removing the inspection apparatus from the liquid crystal display device after the inspection is completed; and attaching driving circuits to the liquid crystal display device having the inspection apparatus removed therefrom.

Abstract: A liquid crystal display and a fabricating method thereof for improving an aperture ratio are disclosed. A liquid crystal display (LCD) according to the present invention includes a gate line, a data line and a common line on the thin film transistor array substrate, the gate line crossing the data line to define a pixel region; a thin film transistor near the crossing of the gate line and the data line; a common electrode connected to the common line in the pixel region; and a pixel electrode connected to the thin film transistor in the pixel area for forming an in-plane electric field in association with the common electrode during an operation of the LCD, wherein an edge of the pixel electrode overlaps the common line with at least one insulating layer there between, and an edge of the common electrode overlaps the pixel electrode with said at least one insulating layer therebetween.

Abstract: A method and apparatus for testing a liquid crystal display device are provided to detect a defect location precisely and rapidly without requiring a jig. The method includes providing an inspection apparatus as a removable portion of the liquid crystal display device; inspecting the display part of the liquid crystal display device using the inspection apparatus; removing the inspection apparatus from the liquid crystal display device after the inspection is completed; and attaching driving circuits to the liquid crystal display device having the inspection apparatus removed therefrom.

Abstract: A method and apparatus are provided for inspecting an electrical defectiveness of a liquid crystal display substrate. The method includes shorting ESD protection devices with a conductive shorting bar to form a current path on each of signal wirings of the substrate, supplying a current to the signal wirings, and determining a defectiveness of the signal wirings depending on the current flowing on the signal wirings.

Abstract: A method and apparatus for testing a liquid crystal display device are provided to detect a defect location precisely and rapidly without requiring a jig. The method includes providing an inspection apparatus as a removable portion of the liquid crystal display device; inspecting the display part of the liquid crystal display device using the inspection apparatus; removing the inspection apparatus from the liquid crystal display device after the inspection is completed; and attaching driving circuits to the liquid crystal display device having the inspection apparatus removed therefrom.

Abstract: A novel method and apparatus inspects liquid crystal display. The method and apparatus for inspecting the flat display device scans at least one signal wire by using a magnetic sensor and detects a resistance change of the magnetic sensor to perceive a short in the signal wire. Pixels can be tested using an array of magnetic sensors configured such that each sensor in the array is smaller than the pixel.

Abstract: A transflective LCD device includes first and second transparent substrates spaced apart from each other and having a reflective portion and a transmissive portion, an insulator on the first transparent substrate, a passivation layer on the insulator within the reflective portion, a reflector on the passivation layer, a transparent pixel electrode disposed over the insulator covering the reflector and the passivation layer, a buffer pattern disposed on a rear surface of the second substrate, the buffer pattern having a saw-tooth shape corresponding to the reflective portion, a color filter on the rear surface of the second substrate covering the buffer pattern, the color filter having a first thickness in the transmissive portion and a second thickness in the reflective portion, a transparent common electrode on a rear surface of the color filter, and a liquid crystal layer between the transparent pixel electrode and the transparent common electrode.

Abstract: A method and apparatus are provided for inspecting an electrical defectiveness of a liquid crystal display substrate. The method includes shorting ESD protection devices with a conductive shorting bar to form a current path on each of signal wirings of the substrate, supplying a current to the signal wirings, and determining a defectiveness of the signal wirings depending on the current flowing on the signal wirings.

Abstract: A transflective LCD device includes first and second transparent substrates spaced apart from each other and having a reflective portion and a transmissive portion, an insulator on the first transparent substrate, a passivation layer on the insulator within the reflective portion, a reflector on the passivation layer, a transparent pixel electrode disposed over the insulator covering the reflector and the passivation layer, a buffer pattern disposed on a rear surface of the second substrate, the buffer pattern having a saw-tooth shape corresponding to the reflective portion, a color filter on the rear surface of the second substrate covering the buffer pattern, the color filter having a first thickness in the transmissive portion and a second thickness in the reflective portion, a transparent common electrode on a rear surface of the color filter, and a liquid crystal layer between the transparent pixel electrode and the transparent common electrode.

Abstract: A method and apparatus for testing a liquid crystal display device are provided to detect a defect location precisely and rapidly without requiring a jig. The method includes providing a substrate to inspect, wherein the substrate includes signal wirings, drive switches and capacitors formed in an effective display area of the substrate; radiating a light onto an inspection switch device and thereby supplying an inspection voltage from an inspection line to one of the drive switches through the signal wirings, so as to charge one of the capacitors; and determining if there is a defect in the effective display area of the substrate by reading the charged voltage of the capacitor.

Abstract: A thin film transistor liquid crystal display is designed such that TFTs for driving green pixels are formed in the blue pixel regions. This improves the overall brightness of the liquid crystal display based on the human view-sensitive characteristics.

Abstract: A method and apparatus tests a flat display device to inspect for shorts and open circuits in a signal wire by using a magnetic sensor. The inspection method and apparatus scans the magnetic sensor along signal wires in a scan direction crossing multiple signal wires and detects at least one of a short or an open circuit in the signal wires based on current detected by the magnetic sensor.

Abstract: A method for fabrication a substrate for a liquid crystal display device includes: forming a color filter layer on a substrate; coating an organic layer on the color filter layer; irradiating a first light onto the organic layer; irradiating a second light onto the organic layer through a mask having a transmitting portion and a shielding portion, an energy density of the first light smaller than an energy density of the second light; and forming an overcoat layer and a column spacer by developing the organic layer.

Abstract: A method and apparatus tests a flat display device to inspect for shorts and open circuits in a signal wire by using a magnetic sensor. The inspection method and apparatus scans the magnetic sensor along signal wires in a scan direction crossing multiple signal wires and detects at least one of a short or an open circuit in the signal wires based on current detected by the magnetic sensor.

Abstract: A novel method and apparatus inspects liquid crystal display. The method and apparatus for inspecting the flat display device scans at least one signal wire by using a magnetic sensor and detects a resistance change of the magnetic sensor to perceive a short in the signal wire. Pixels can be tested using an array of magnetic sensors configured such that each sensor in the array is smaller than the pixel.

Abstract: A method and apparatus are provided for inspecting an electrical defectiveness of a liquid crystal display substrate. The method includes shorting ESD protection devices with a conductive shorting bar to form a current path on each of signal wirings of the substrate, supplying a current to the signal wirings, and determining a defectiveness of the signal wirings depending on the current flowing on the signal wirings.