Abstract: A method and apparatus are provided for inspecting an electrical defectiveness of a liquid crystal display substrate. The method includes shorting ESD protection devices with a conductive shorting bar to form a current path on each of signal wirings of the substrate, supplying a current to the signal wirings, and determining a defectiveness of the signal wirings depending on the current flowing on the signal wirings.

Abstract: A method and apparatus for testing a liquid crystal display device are provided to detect a defect location precisely and rapidly without requiring a jig. The method includes providing an inspection apparatus as a removable portion of the liquid crystal display device; inspecting the display part of the liquid crystal display device using the inspection apparatus; removing the inspection apparatus from the liquid crystal display device after the inspection is completed; and attaching driving circuits to the liquid crystal display device having the inspection apparatus removed therefrom.

Abstract: A liquid crystal display and a fabricating method thereof for improving an aperture ratio are disclosed. A liquid crystal display (LCD) according to the present invention includes a gate line, a data line and a common line on the thin film transistor array substrate, the gate line crossing the data line to define a pixel region; a thin film transistor near the crossing of the gate line and the data line; a common electrode connected to the common line in the pixel region; and a pixel electrode connected to the thin film transistor in the pixel area for forming an in-plane electric field in association with the common electrode during an operation of the LCD, wherein an edge of the pixel electrode overlaps the common line with at least one insulating layer therebetween, and an edge of the common electrode overlaps the pixel electrode with said at least one insulating layer therebetween.