Patents by Inventor Seema Somani
Seema Somani has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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System and method of preparing integrated circuits for backside probing using charged particle beams
Patent number: 11605525Abstract: Described herein are a system and method of preparing integrated circuits (ICs) so that the ICs remain electrically active and can have their active circuitry probed for diagnostic and characterization purposes using charged particle beams. The system employs an infrared camera capable of looking through the silicon substrate of the ICs to image electrical circuits therein, a focused ion beam system that can both image the IC and selectively remove substrate material from the IC, a scanning electron microscope that can both image structures on the IC and measure voltage contrast signals from active circuits on the IC, and a means of extracting heat generated by the active IC. The method uses the system to identify the region of the IC to be probed, and to selectively remove all substrate material over the region to be probed using ion bombardment, and further identifies endpoint detection means of milling to the required depth so as to observe electrical states and waveforms on the active IC.Type: GrantFiled: December 10, 2020Date of Patent: March 14, 2023Assignee: FEI CompanyInventors: James Vickers, Seema Somani, Cecelia Campochiaro, Yakov Bobrov -
System and method of preparing integrated circuits for backside probing using charged particle beams
Publication number: 20210098228Abstract: Described herein are a system and method of preparing integrated circuits (ICs) so that the ICs remain electrically active and can have their active circuitry probed for diagnostic and characterization purposes using charged particle beams. The system employs an infrared camera capable of looking through the silicon substrate of the ICs to image electrical circuits therein, a focused ion beam system that can both image the IC and selectively remove substrate material from the IC, a scanning electron microscope that can both image structures on the IC and measure voltage contrast signals from active circuits on the IC, and a means of extracting heat generated by the active IC. The method uses the system to identify the region of the IC to be probed, and to selectively remove all substrate material over the region to be probed using ion bombardment, and further identifies endpoint detection means of milling to the required depth so as to observe electrical states and waveforms on the active IC.Type: ApplicationFiled: December 10, 2020Publication date: April 1, 2021Inventors: James VICKERS, Seema SOMANI, Cecelia CAMPOCHIARO, Yakov BOBROV -
Publication number: 20200333394Abstract: Methods and systems for optically determining the performance of active components of a device under test (DUT). A portion of the DUT that includes a target active component and an additional active component is illuminated and reflected energy from the target active component and the additional active component is detected by one or more sensors. An analog signal that corresponds to the reflected energy is generated by a processor. An estimated target signal determined based on the analog signal and the second analog signal, where the estimated target signal corresponds to an estimated component of the analog signal that is attributable to the target reflected energy reflected by the target active component. The estimated target signal is then used to determine the performance of the target active component of the DUT.Type: ApplicationFiled: April 18, 2019Publication date: October 22, 2020Applicant: FEI CompanyInventors: Tenzile Berkin Cilingiroglu, Neel Leslie, Seema Somani, Prasad Sabbineni
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System and method of preparing integrated circuits for backside probing using charged particle beams
Publication number: 20190287762Abstract: Described herein are a system and method of preparing integrated circuits (ICs) so that the ICs remain electrically active and can have their active circuitry probed for diagnostic and characterization purposes using charged particle beams. The system employs an infrared camera capable of looking through the silicon substrate of the ICs to image electrical circuits therein, a focused ion beam system that can both image the IC and selectively remove substrate material from the IC, a scanning electron microscope that can both image structures on the IC and measure voltage contrast signals from active circuits on the IC, and a means of extracting heat generated by the active IC. The method uses the system to identify the region of the IC to be probed, and to selectively remove all substrate material over the region to be probed using ion bombardment, and further identifies endpoint detection means of milling to the required depth so as to observe electrical states and waveforms on the active IC.Type: ApplicationFiled: January 22, 2019Publication date: September 19, 2019Inventors: James VICKERS, Seema SOMANI, Cecelia CAMPOCHIARO, Yakov BOBROV -
System and method of preparing integrated circuits for backside probing using charged particle beams
Publication number: 20190227119Abstract: Described herein are a system and method of preparing integrated circuits (ICs) so that the ICs remain electrically active and can have their active circuitry probed for diagnostic and characterization purposes using charged particle beams. The system employs an infrared camera capable of looking through the silicon substrate of the ICs to image electrical circuits therein, a focused ion beam system that can both image the IC and selectively remove substrate material from the IC, a scanning electron microscope that can both image structures on the IC and measure voltage contrast signals from active circuits on the IC, and a means of extracting heat generated by the active IC. The method uses the system to identify the region of the IC to be probed, and to selectively remove all substrate material over the region to be probed using ion bombardment, and further identifies endpoint detection means of milling to the required depth so as to observe electrical states and waveforms on the active IC.Type: ApplicationFiled: January 22, 2019Publication date: July 25, 2019Inventors: James VICKERS, Seema SOMANI, Cecelia CAMPOCHIARO, Yakov BOBROV -
Patent number: 10213102Abstract: Devices, systems, and methods for treating and/or determining appropriate prescriptions for one or both eyes of a patient are particularly well-suited for addressing presbyopia, often in combination with concurrent treatments of other vision defects. High-order spherical aberration may be imposed in one or both of a patient's eyes, often as a controlled amount of negative spherical aberration extending across a pupil. A desired presbyopia-mitigating quantity of high-order spherical aberration may be defined by one or more spherical Zernike coefficients, which may be combined with Zernike coefficients generated from a wavefront aberrometer. The resulting prescription can be imposed using refractive surgical techniques such as laser eye surgery, using intraocular lenses and other implanted structures, using contact lenses, using temporary or permanent corneal reshaping techniques, and/or the like.Type: GrantFiled: May 3, 2016Date of Patent: February 26, 2019Assignee: AMO Manufacturing USA, LLCInventors: Seema Somani, Kingman Yee
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Publication number: 20160256048Abstract: Devices, systems, and methods for treating and/or determining appropriate prescriptions for one or both eyes of a patient are particularly well-suited for addressing presbyopia, often in combination with concurrent treatments of other vision defects. High-order spherical aberration may be imposed in one or both of a patient's eyes, often as a controlled amount of negative spherical aberration extending across a pupil. A desired presbyopia-mitigating quantity of high-order spherical aberration may be defined by one or more spherical Zernike coefficients, which may be combined with Zernike coefficients generated from a wavefront aberrometer. The resulting prescription can be imposed using refractive surgical techniques such as laser eye surgery, using intraocular lenses and other implanted structures, using contact lenses, using temporary or permanent corneal reshaping techniques, and/or the like.Type: ApplicationFiled: May 3, 2016Publication date: September 8, 2016Inventors: Seema Somani, Kingman Yee
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Patent number: 9358154Abstract: Devices, systems, and methods for treating and/or determining appropriate prescriptions for one or both eyes of a patient are particularly well-suited for addressing presbyopia, often in combination with concurrent treatments of other vision defects. High-order spherical aberration may be imposed in one or both of a patient's eyes, often as a controlled amount of negative spherical aberration extending across a pupil. A desired presbyopia-mitigating quantity of high-order spherical aberration may be defined by one or more spherical Zernike coefficients, which may be combined with Zernike coefficients generated from a wavefront aberrometer. The resulting prescription can be imposed using refractive surgical techniques such as laser eye surgery, using intraocular lenses and other implanted structures, using contact lenses, using temporary or permanent corneal reshaping techniques, and/or the like.Type: GrantFiled: May 6, 2009Date of Patent: June 7, 2016Assignee: AMO Manufacturing USA, LLCInventors: Seema Somani, Kingman Yee
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Patent number: 9339186Abstract: An imaging method according to some embodiments of the present invention includes obtaining working distance information from an optical coherence tomography system, the working distance being the working distance to the sample; obtaining information from one or more ocular systems; combining the information from said optical coherence tomography information and said ocular system; and displaying said combined information.Type: GrantFiled: June 1, 2011Date of Patent: May 17, 2016Assignee: Optovue, Inc.Inventors: Seema Somani, Jay Wei
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Patent number: 9170129Abstract: A system for sensing the position of a movable object includes a polarization maintaining fiber configured to receive light from a light source; an optical system configured to rotate an angle of polarization of the light by a first predetermined angle; a low birefringence fiber connected to the optical system at a first end and having a mirror connected to a second end configured to reflect the light and rotate the angle of polarization at a second predetermined angle, the second end being configured to overlap a magnetic field of the a magnet attached to the object. The angle of polarization is rotated to a third predetermined angle proportional to at least one of the strength of the magnetic field and an amount of the overlap. The optical system is configured to decompose the third predetermined angle into a first component and a second component. A detector is configured to detect a differential between the first and second components indicative of the amount of the overlap.Type: GrantFiled: October 17, 2013Date of Patent: October 27, 2015Assignee: General Electric CompanyInventors: Sachin Narahari Dekate, Glen Peter Kose, Aaron Jay Knobloch, Boon Kwee Lee, Sameer Dinkar Vartak, Seema Somani
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Publication number: 20150108335Abstract: A system for sensing the position of a movable object includes a polarization maintaining fiber configured to receive light from a light source; an optical system configured to rotate an angle of polarization of the light by a first predetermined angle; a low birefringence fiber connected to the optical system at a first end and having a mirror connected to a second end configured to reflect the light and rotate the angle of polarization at a second predetermined angle, the second end being configured to overlap a magnetic field of the a magnet attached to the object. The angle of polarization is rotated to a third predetermined angle proportional to at least one of the strength of the magnetic field and an amount of the overlap. The optical system is configured to decompose the third predetermined angle into a first component and a second component. A detector is configured to detect a differential between the first and second components indicative of the amount of the overlap.Type: ApplicationFiled: October 17, 2013Publication date: April 23, 2015Applicant: GENERAL ELECTRIC COMPANYInventors: Sachin Narahari Dekate, Glen Peter Kose, Aaron Jay Knobloch, Boon Kwee Lee, Sameer Dinkar Vartak, Seema Somani
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Patent number: 8833940Abstract: An eye measurement system may include a target that moves transverse to an optical path from the target to eye, so as to relax accommodation of the lens of the eye. The target may move transverse to the optical path on a display. The patient may be fogged while the target moves transverse to the optical path, and the target may become smaller such that the patient perceives the target to be moving away from the patient. A pupil camera may measure eye position that can be correlated with the position of the target on the display to determine that the patient has maintained fixation on the moving target. A visible measurement light beam may be pulsed subsequent to and/or during motion of the target that relaxes accommodation of the eye so as to avoid visual interference of the measurement light beam with the target on the display.Type: GrantFiled: July 26, 2011Date of Patent: September 16, 2014Assignee: AMO Manufacturing USA, LLCInventors: Kingman Yee, Seema Somani
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Publication number: 20140185056Abstract: A system for sensing the position of a movable object includes a polarization maintaining fiber configured to receive light from a light source; an optical system configured to rotate an angle of polarization of the light by a first predetermined angle; a low birefringence fiber connected to the optical system at a first end and having a mirror connected to a second end configured to reflect the light and rotate the angle of polarization at a second predetermined angle, the second end being configured to overlap a magnetic field of the a magnet attached to the object. The angle of polarization is rotated to a third predetermined angle proportional to at least one of the strength of the magnetic field and an amount of the overlap. The optical system is configured to decompose the third predetermined angle into a first component and a second component. A detector is configured to detect a differential between the first and second components indicative of the amount of the overlap.Type: ApplicationFiled: December 31, 2012Publication date: July 3, 2014Applicant: GENERAL ELECTRIC COMPANYInventors: Sachin Narahari Dekate, Glen Peter Koste, Aaron Jay Knobloch, Boon Kwee Lee, Sameer Dinkar Vartak, Seema Somani
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Patent number: 8142499Abstract: Devices, systems, and methods for treating and/or determining appropriate prescriptions for one or both eyes of a patient are particularly well-suited for addressing presbyopia, often in combination with concurrent treatments of other vision defects. High-order spherical aberration may be imposed in one or both of a patient's eyes, often as a controlled amount of negative spherical aberration extending across a pupil. A desired presbyopia-mitigating quantity of high-order spherical aberration may be defined by one or more spherical Zernike coefficients, which may be combined with Zernike coefficients generated from a wavefront aberrometer. The resulting prescription can be imposed using refractive surgical techniques such as laser eye surgery, using intraocular lenses and other implanted structures, using contact lenses, using temporary or permanent corneal reshaping techniques, and/or the like.Type: GrantFiled: September 9, 2008Date of Patent: March 27, 2012Assignee: AMO Manufacturing USA, LLC.Inventors: Seema Somani, Kingman Yee
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Publication number: 20110292341Abstract: An imaging method according to some embodiments of the present invention includes obtaining working distance information from an optical coherence tomography system, the working distance being the working distance to the sample; obtaining information from one or more ocular systems; combining the information from said optical coherence tomography information and said ocular system; and displaying said combined information.Type: ApplicationFiled: June 1, 2011Publication date: December 1, 2011Inventors: Seema SOMANI, Jay WEI
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Publication number: 20110279777Abstract: An eye measurement system may include a target that moves transverse to an optical path from the target to eye, so as to relax accommodation of the lens of the eye. The target may move transverse to the optical path on a display. The patient may be fogged while the target moves transverse to the optical path, and the target may become smaller such that the patient perceives the target to be moving away from the patient. A pupil camera may measure eye position that can be correlated with the position of the target on the display to determine that the patient has maintained fixation on the moving target. A visible measurement light beam may be pulsed subsequent to and/or during motion of the target that relaxes accommodation of the eye so as to avoid visual interference of the measurement light beam with the target on the display.Type: ApplicationFiled: July 26, 2011Publication date: November 17, 2011Applicant: AMO Development, LLCInventors: Kingman Yee, Seema Somani
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Patent number: 8016420Abstract: An eye measurement system may include a target that moves transverse to an optical path from the target to eye, so as to relax accommodation of the lens of the eye. The target may move transverse to the optical path on a display. The patient may be fogged while the target moves transverse to the optical path, and the target may become smaller such that the patient perceives the target to be moving away from the patient. A pupil camera may measure eye position that can be correlated with the position of the target on the display to determine that the patient has maintained fixation on the moving target. A visible measurement light beam may be pulsed subsequent to and/or during motion of the target that relaxes accommodation of the eye so as to avoid visual interference of the measurement light beam with the target on the display.Type: GrantFiled: May 17, 2007Date of Patent: September 13, 2011Assignee: AMO Development LLC.Inventors: Kingman Yee, Seema Somani
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Patent number: 7771048Abstract: Devices, systems, and methods measure, diagnose, and/or treat one or both eyes of a patient. Adaptive optics systems (such as those having a deformable mirror) may be configured to an aspherical or multi-spherical presbyopia-mitigating prescriptive shape to allow objective and/or subjective measurements of a candidate prescription. A plurality of viewing distances allow subjective and/or objective evaluations of performance using a light spot or a test viewing image. Measurements of aberrations at selected viewing conditions (including distances and/or brightness) with correlating pupil sizes may also be provided. Wavefront measurement systems and methods may help position and isolate the eye from ambient light.Type: GrantFiled: December 15, 2008Date of Patent: August 10, 2010Assignee: AMO Manufacturing USA LLCInventors: Guangming Dai, Seema Somani
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Patent number: 7738176Abstract: Apparatus for homogenizing a laser beam includes a lenslet array. In some embodiments, the lenslets have a negative power. The lenslet array may include from 16 to 36 effective lenslets in some embodiments, or any other suitable number in alternative embodiments. Some embodiments additionally include a re-focusing lens for directing the beamlets onto a target so that the beamlets overlap and the energy distribution is homogenized. In an alternative embodiment, the lenslet array and re-focusing lens are combined in one optic.Type: GrantFiled: May 15, 2008Date of Patent: June 15, 2010Assignee: AMO Manufacturing USA LLC.Inventors: Seema Somani, Charles Munnerlyn, Mark Arnoldussen, John Osborn
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Patent number: 7731363Abstract: Methods, systems and software for determining an optical surface model for an optical tissue system using Fourier transformation algorithms. A method of reconstructing optical tissues of an eye comprises transmitting an image through the optical tissues of the eye. The surface gradients from the transmitted image are measured across the optical tissues of the eye. A Fourier transform algorithm is applied to the surface gradients to reconstruct an optical surface model that corresponds to the optical tissues of the eye.Type: GrantFiled: March 18, 2008Date of Patent: June 8, 2010Assignee: AMO Manufacturing USA, LLC.Inventors: Dimitri Chernyak, Charles E. Campbell, Erik Gross, Seema Somani, Guangming Dai