Patents by Inventor Seena Dehkharghani

Seena Dehkharghani has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12002584
    Abstract: Systems and methods for detecting dielectric changes in matter are provided. The system includes a data collection array to collect microwave scattering data and a machine learning device. The machine learning device is configured to receive the microwave scattering data, patient information, and imaging modality data corresponding to at least one of a presence of disease, absence of disease, or one or more disease features; analyze the microwave scattering data, patient information, and imaging modality data; output at least one of a predicted disease state and predicted features based on the analyzed microwave scattering data, patient information, and imaging modality data; compare the imaging modality data corresponding to the at least one of a presence of disease, absence of disease, or one or more disease features to the predicted disease state or predicted features; and use the comparison as an input into the machine learning device.
    Type: Grant
    Filed: July 8, 2021
    Date of Patent: June 4, 2024
    Assignee: New York University
    Inventors: Leeor Alon, Seena Dehkharghani
  • Publication number: 20210335493
    Abstract: Systems and methods for detecting dielectric changes in matter are provided. The system includes a data collection array to collect microwave scattering data and a machine learning device. The machine learning device is configured to receive the microwave scattering data, patient information, and imaging modality data corresponding to at least one of a presence of disease, absence of disease, or one or more disease features; analyze the microwave scattering data, patient information, and imaging modality data; output at least one of a predicted disease state and predicted features based on the analyzed microwave scattering data, patient information, and imaging modality data; compare the imaging modality data corresponding to the at least one of a presence of disease, absence of disease, or one or more disease features to the predicted disease state or predicted features; and use the comparison as an input into the machine learning device.
    Type: Application
    Filed: July 8, 2021
    Publication date: October 28, 2021
    Applicant: NEW YORK UNIVERSITY
    Inventors: Leeor Alon, Seena Dehkharghani