Patents by Inventor Sehyug JEON

Sehyug JEON has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for detecting circuit defects
    Patent number: 11709196
    Abstract: The disclosure relates to an RFIC apparatus, and more particularly, to an RFIC circuit having a test circuit, a test apparatus, and a test method thereof. Further, the disclosure relates to a method for estimating or determining a DC gain using a test apparatus and an RF circuit in a DC/AC test stage, and detecting defects of the RF circuit based on the estimated or determined DC gain.
    Type: Grant
    Filed: July 16, 2021
    Date of Patent: July 25, 2023
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Donggyu Minn, Daehyun Kang, Yonghoon Kim, Jihoon Kim, Hyundo Ryu, Jeeho Park, Sunggi Yang, Youngchang Yoon, Sehyug Jeon
  • METHOD AND APPARATUS FOR DETECTING CIRCUIT DEFECTS
    Publication number: 20220018892
    Abstract: The disclosure relates to an RFIC apparatus, and more particularly, to an RFIC circuit having a test circuit, a test apparatus, and a test method thereof. Further, the disclosure relates to a method for estimating or determining a DC gain using a test apparatus and an RF circuit in a DC/AC test stage, and detecting defects of the RF circuit based on the estimated or determined DC gain.
    Type: Application
    Filed: July 16, 2021
    Publication date: January 20, 2022
    Inventors: Donggyu MINN, Daehyun KANG, Yonghoon KIM, Jihoon KIM, Hyundo RYU, Jeeho PARK, Sunggi YANG, Youngchang YOON, Sehyug JEON