Patents by Inventor Sei Ri

Sei Ri has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7345816
    Abstract: An optical microscope includes a light source which irradiates a sample with illuminating light. A mirror, which has a variable reflection surface, reflects the illuminating light. A correction table stores plural data of plural shapes of the reflection surface which correspond to changes in a focal position and an aberration. A controller selects, from the plural data stored in the correction table, data of one of the shapes of the reflection surface that is suitable for correcting the focal position and the aberration. And the controller controls the mirror so that the reflection surface forms the shape corresponding to the selected data.
    Type: Grant
    Filed: December 30, 2005
    Date of Patent: March 18, 2008
    Assignee: Olympus Corporation
    Inventor: Sei Ri
  • Patent number: 7326899
    Abstract: Provided is a laser scanning microscope having a first focusing-position control unit; and a confocal detecting unit. The first focusing-position control unit shifts a first focusing position of a laser beam on a sample in a direction of an optical axis of an objective lens. The confocal detecting unit has a confocal aperture for a confocal detection of a light emitted from the first focusing position. The microscope may include a second focusing-position control unit shifts a second focusing position of the light emitted from the first focusing position focused by the confocal detecting unit in a direction of an optical path thereof.
    Type: Grant
    Filed: July 11, 2006
    Date of Patent: February 5, 2008
    Assignee: Olympus Corporation
    Inventor: Sei Ri
  • Publication number: 20070007428
    Abstract: Provided is a laser scanning microscope having a first focusing-position control unit; and a confocal detecting unit. The first focusing-position control unit shifts a first focusing position of a laser beam on a sample in a direction of an optical axis of an objective lens. The confocal detecting unit has a confocal aperture for a confocal detection of a light emitted from the first focusing position. The microscope may include a second focusing-position control unit shifts a second focusing position of the light emitted from the first focusing position focused by the confocal detecting unit in a direction of an optical path thereof.
    Type: Application
    Filed: July 11, 2006
    Publication date: January 11, 2007
    Applicant: Olympus Corporation
    Inventor: Sei Ri
  • Publication number: 20060152799
    Abstract: An optical microscope includes a light source irradiating a sample with an illuminating light; a mirror having a variable reflection surface for reflecting the illuminating light; a correction table storing data of plural shapes of the reflection surface which correspond to changes in a focal position and an aberration; and a controller selecting from the plural shapes of the reflection surface a reflection surface suitable for corrections of the focal position and aberration, and controlling the mirror so that the selected reflection surface is formed.
    Type: Application
    Filed: December 30, 2005
    Publication date: July 13, 2006
    Applicant: Olympus Corporation
    Inventor: Sei Ri