Abstract: An inhibition device includes: a location information obtaining section that obtains, from a computing device, information on a touch location; a operation determining section that determines, in accordance with the information on the touch location, whether or not an operation of a user is an operation for causing the computing device to execute a predetermined process; and an inhibition information transmitting section that transmits inhibition information.

Abstract: An inhibition device includes: a location information obtaining section that obtains, from a computing device, information on a touch location; a operation determining section that determines, in accordance with the information on the touch location, whether or not an operation of a user is an operation for causing the computing device to execute a predetermined process; and an inhibition information transmitting section that transmits inhibition information.

Abstract: A mobile phone (1) which displays a scrollable screen includes a degraded operation setting section (104). In a case where a scrollable screen is being displayed when an operation input for instructing a scrolling is accepted, the degraded operation setting section (104) inhibits degraded operation for a predetermined time period and, in a case where a scrollable screen is not displayed, the degraded operation setting section (104) causes the process to be carried out in the degraded state.

Abstract: To provide a video recorder that can receive a plurality of broadcast signals having different channels to perform video recording.

Abstract: A stress-detection semiconductor device has a stress detection circuit for detecting electrostatic stress applied to a product semiconductor device. The stress detection circuit has a plurality of stress detection units each including a resistor and a stress registering element connected to the resistor, and a resistance value of the resistor is specified as a different value by each of the plurality of stress detection units. The stress-detection semiconductor device is accompanied by a plurality of product semiconductor devices and sent through a plurality of production processes, and the electrostatic stress applied to the product semiconductor devices during each of the production processes is detected by measuring and comparing characteristics of the stress registering element before and after each of the production processes.