Patents by Inventor Seiichi Kageyama

Seiichi Kageyama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Inspection device and inspection method
    Patent number: 7696767
    Abstract: A first conductive contact connecting a first electrode of an inspection circuit board and one external electrode of a semiconductor integrated circuit is arranged in a fixed member. A second conductive contact connecting a second electrode of a wiring board and the other external electrode of the semiconductor integrated circuit is arranged in a movable member. A third conductive contact connecting one third electrode of the inspection circuit board and the other third electrode of the wiring board is arranged in the movable member. The other third electrode is connected to the second electrode. When the movable member moves to the contacting position, the second conductive contact makes contact with the other external electrode, and the third conductive contact makes contact with the one third electrode.
    Type: Grant
    Filed: July 16, 2009
    Date of Patent: April 13, 2010
    Assignee: Panasonic Corporation
    Inventors: Keisuke Inoue, Nobuhiro Katsuma, Seiichi Kageyama, Masanori Hamada, Takashi Ogawa
  • Inspection device and inspection method
    Publication number: 20090278559
    Abstract: A first conductive contact connecting a first electrode of an inspection circuit board and one external electrode of a semiconductor integrated circuit is arranged in a fixed member. A second conductive contact connecting a second electrode of a wiring board and the other external electrode of the semiconductor integrated circuit is arranged in a movable member. A third conductive contact connecting one third electrode of the inspection circuit board and the other third electrode of the wiring board is arranged in the movable member. The other third electrode is connected to the second electrode. When the movable member moves to the contacting position, the second conductive contact makes contact with the other external electrode, and the third conductive contact makes contact with the one third electrode.
    Type: Application
    Filed: July 16, 2009
    Publication date: November 12, 2009
    Applicant: Panasonic Corporation
    Inventors: Keisuke Inoue, Nobuhiro Katsuma, Seiichi Kageyama, Masanori Hamada, Takashi Ogawa
  • Inspection device and inspection method
    Patent number: 7598756
    Abstract: A first conductive contact connecting a first electrode of an inspection circuit board and one external electrode of a semiconductor integrated circuit is arranged in a fixed member. A second conductive contact connecting a second electrode of a wiring board and the other external electrode of the semiconductor integrated circuit is arranged in a movable member. A third conductive contact connecting one third electrode of the inspection circuit board and the other third electrode of the wiring board is arranged in the movable member. The other third electrode is connected to the second electrode. When the movable member moves to the contacting position, the second conductive contact makes contact with the other external electrode, and the third conductive contact makes contact with the one third electrode.
    Type: Grant
    Filed: November 16, 2006
    Date of Patent: October 6, 2009
    Assignee: Panasonic Corporation
    Inventors: Keisuke Inoue, Nobuhiro Katsuma, Seiichi Kageyama, Masanori Hamada, Takashi Ogawa
  • Inspection device and inspection method
    Publication number: 20070109000
    Abstract: A first conductive contact connecting a first electrode of an inspection circuit board and one external electrode of a semiconductor integrated circuit is arranged in a fixed member. A second conductive contact connecting a second electrode of a wiring board and the other external electrode of the semiconductor integrated circuit is arranged in a movable member. A third conductive contact connecting one third electrode of the inspection circuit board and the other third electrode of the wiring board is arranged in the movable member. The other third electrode is connected to the second electrode. When the movable member moves to the contacting position, the second conductive contact makes contact with the other external electrode, and the third conductive contact makes contact with the one third electrode.
    Type: Application
    Filed: November 16, 2006
    Publication date: May 17, 2007
    Applicant: Matsushita Electric Industrial Co., Ltd.
    Inventors: Keisuke Inoue, Nobuhiro Katsuma, Seiichi Kageyama, Masanori Hamada, Takashi Ogawa