Patents by Inventor Seiichiro Yoshioka

Seiichiro Yoshioka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus and method of cataloging test data by icons
    Patent number: 7483027
    Abstract: An analyzer according to this invention is configured to retrieve an analysis data file quickly.
    Type: Grant
    Filed: August 17, 2005
    Date of Patent: January 27, 2009
    Assignee: Horiba, Ltd.
    Inventors: Seiichiro Yoshioka, Yoshiyuki Okada, Tatsuo Igushi, Loic Merckel
  • Particle size distribution analyzer
    Patent number: 7180592
    Abstract: A particle size distribution analyzer is equipped with cells, a light source, to irradiate particles in a cell and multiple photo-detectors that detect a light intensity of a diffraction light and/or a scattering light generated from the particles. An information processor calculates particle size distribution based upon light intensity signals transmitted from each of the photo-detectors. A movement retention unit moves the cells between a light irradiation position and withdrawal positions. A stop unit can stop one of the cells at the light irradiation position. A cell identification unit identifies a cell situated at the light irradiation position and transmits an identification signal of the cell to the information processor, which is equipped with a program switch unit that automatically switches to an appropriate program for controlling the operation of the analyzer corresponding to the cell identification signal.
    Type: Grant
    Filed: July 25, 2005
    Date of Patent: February 20, 2007
    Assignee: Horiba, Ltd.
    Inventors: Seiichiro Yoshioka, Yoshiyuki Okada
  • Apparatus and method of cataloging test data by icons
    Publication number: 20060055697
    Abstract: An analyzer according to this invention is configured to retrieve an analysis data file quickly.
    Type: Application
    Filed: August 17, 2005
    Publication date: March 16, 2006
    Inventors: Seiichiro Yoshioka, Yoshiyuki Okada, Tatsuo Igushi, Loic Merckel
  • Particle size distribution analyzer
    Publication number: 20060016968
    Abstract: The particle size distribution analyzer of the present invention is equipped with cells C; a light source 2 that irradiates a light L onto particles within the cells C; multiple photo-detectors 31 and 32 that detect the light intensity of a diffraction light and/or a scattering light generated from the particles irradiated by the light L. An information processor 5 calculates particle size distribution of the above-mentioned particles based upon light intensity signals transmitted from each of the above-mentioned photo-detectors 31 and 32, movement retention unit 6 can enable the cells C to be movable between a light irradiation position P where one of the above-mentioned cells C is irradiated by the above-mentioned light L and withdrawal positions established at different positions from the light irradiation position P. A stop unit can stop one of the cells C at the above-mentioned light irradiation position P.
    Type: Application
    Filed: July 25, 2005
    Publication date: January 26, 2006
    Inventors: Seiichiro Yoshioka, Yoshiyuki Okada
  • Particle size distribution measuring apparatus with validation and instruction modes
    Patent number: 6741350
    Abstract: This invention provides a particle size distribution measuring apparatus, which has a function of informing an operator of a procedure of validation work of the particle size distribution measuring apparatus. A storage medium which records validation data providing a procedure of validation work for the particle size distribution measuring apparatus and a control unit which has a validation help function which successively reads a validation procedure from the validation data and controls the particle size distribution measuring apparatus according to a measuring procedure without any operation by an operator in the validation procedure while teaching the operator a work procedure requiring an operation by the operator.
    Type: Grant
    Filed: May 16, 2001
    Date of Patent: May 25, 2004
    Assignee: Horiba, Ltd.
    Inventors: Hideyuki Ikeda, Seiichiro Yoshioka
  • Particle size distribution measuring apparatus with validation and instruction modes
    Publication number: 20010048366
    Abstract: This invention provides a particle size distribution measuring apparatus, which has a function of informing an operator of a procedure of validation work of the particle size distribution measuring apparatus. A storage medium which records validation data providing a procedure of validation work for the particle size distribution measuring apparatus and a control unit which has a validation help function which successively reads a validation procedure from the validation data and controls the particle size distribution measuring apparatus according to a measuring procedure without any operation by an operator in the validation procedure while teaching the operator a work procedure requiring an operation by the operator.
    Type: Application
    Filed: May 16, 2001
    Publication date: December 6, 2001
    Inventors: Hideyuki Ikeda, Seiichiro Yoshioka