Patents by Inventor Seiichiroo Terashima

Seiichiroo Terashima has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Fine clearance measuring apparatus
    Patent number: 4630926
    Abstract: One of two articles arranged to form a fine clearance therebetween is made of a transparent material through which a light flux is impinged to the other article to form a reflection light which includes an interference fringe pattern information representing the fine clearance between the two articles. The reflection light is focused on a photo-electric conversion plane and converted to an electrical signal. The photo-electrically converted interference fringe pattern information is then converted to digital information, which is stored in a frame memory. A computer reads out the digital information from the frame memory and determines peak positions of light and/or dark areas of the interference fringe to measure the fine clearance between the two articles.
    Type: Grant
    Filed: July 23, 1984
    Date of Patent: December 23, 1986
    Assignee: Hitachi, Ltd.
    Inventors: Katsuyuki Tanaka, Seiichiroo Terashima, Yoshinori Takeuchi, Toshiko Odaka, Yokuo Saito