Abstract: A nanosize heater-mounted nozzle is configured of a nozzle for locally supplying a source gas toward a substrate W; a pair of electrodes located on a side face of the nozzle; and a nanosize heater formed of carbon nanotube or the like, in which the nanosize heater is connected between the electrodes so as to pass over the opening of the nozzle, for heating the source gas by current flowing, whereby easily realizing localized deposition within a limited region on a substrate.

Abstract: A nanotube probe assembled under real-time observation inside an electron microscope, the probe including a nanotube; a holder for holding the nanotube; and a fastening means for fastening the nanotube at a base end portion thereof to the holder; and the tip end portion of the nanotube protrudes from the holder. The method for manufacturing a nanotube probe includes the steps of setting up a nanotube and a holder inside an electron microscope; allowing a base end portion of the nanotube, with a tip end portion thereof protruding, to come into contact with the holder; and irradiating electron beam to the base end portion of the nanotube to form a carbon film at the base end portion of the nanotube, or forming a fused part at the base end portion of the nanotube, thus fastening the base end portion of the nanotube to the holder by the carbon film.

Abstract: The coated nanotube surface signal probe constructed from a nanotube, a holder which holds the nanotube, a coating film fastening a base end portion of the nanotube to a surface of the holder by way of adhering the base end portion on the surface of holder in a range of a base end portion length with an electric contact state and covering a specified region including the base end portion with the coating film maintaining the electric contact state between the nanotube and the holder, a tip end portion of the nanotube being caused to protrude from the holder; and the tip end portion is used as a probe needle so as to scan surface signals. The coated nanotube surface signal probe can be used as a probe in AFM (Atomic Force Microscope), STM (Scanning Tunneling Microscope) other SPM (Scanning Probe Microscope).

Abstract: A method for manufacturing a nanotube cartridge including the steps of: adhering numerous nanotubes to a surface of a holder, disposing a knife edge at an inclination to the surface of the holder so that the knife edge is raised with its tip end being in contact with the surface of the holder, and collecting the nanotubes to near the tip end of the knife edge by moving the knife edge in a direction opposite from the tip end with the tip end being kept in contact with the surface, thus allowing the nanotubes to be arranged on the tip end of the knife edge with the nanotubes protruding from the tip end. When adhering the nanotubes to the holder surface, nanotubes are merely put in a vessel, the holder is placed in the vessel, and then the vessel is vibrated.

Abstract: To provide nanotweezers and a nanomanipulator which allow great miniaturization of the component and are capable of gripping various types of nano-substances such as insulators, semiconductors and conductors and of gripping nano-substances of various shapes. Electrostatic nanotweezers 2 are characterized in that the nanotweezers 2 are comprised of a plurality of nanotubes whose base end portions are fastened to a holder 6 so that the nanotubes protrude from the holder 6, coating films which insulate and cover the surfaces of the nanotubes, and lead wires 10, 10 which are connected to two of the nanotubes 8, 9; and the tip ends of the two nanotubes are freely opened and closed by means of an electrostatic attractive force generated by applying a voltage across these lead wires.

Abstract: To provide nanotweezers and a nanomanipulator which allow great miniaturization of the component and are capable of gripping various types of nano-substances such as insulators, semiconductors and conductors and of gripping nano-substances of various shapes. Electrostatic nanotweezers 2 are characterized in that the nanotweezers 2 are comprised of a plurality of nanotubes whose base end portions are fastened to a holder 6 so that the nanotubes protrude from the holder 6, coating films which insulate and cover the surfaces of the nanotubes, and lead wires 10, 10 which are connected to two of the nanotubes 8, 9; and the tip ends of the two nanotubes are freely opened and closed by means of an electrostatic attractive force generated by applying a voltage across these lead wires.

Abstract: The coated nanotube surface signal probe constructed from a nanotube, a holder which holds the nanotube, a coating film fastening a base end portion of the nanotube to a surface of the holder by way of adhering the base end portion on the surface of holder in a range of a base end portion length with an electric contact state and covering a specified region including the base end portion with the coating film maintaining the electric contact state between the nanotube and the holder, a tip end portion of the nanotube being caused to protrude from the holder; and the tip end portion is used as a probe needle so as to scan surface signals. The coated nanotube surface signal probe can be used as a probe in AFM (Atomic Force Microscope), STM (Scanning Tunneling Microscope) other SPM (Scanning Probe Microscope).

Abstract: A conductive probe for a scanning type microscope that captures the substance information of the surface of a specimen by the tip end of a conductive nanotube probe needle fastened to a cantilever, in which the conductive probe is constructed from a conductive film formed on the surface of the cantilever, a conductive nonatube with its base end portion being fixed in contact which the surface of a predetermined of the cantilever, and a conductive deposit which fastens the conductive nanotube by covering from the base end portion of the nonatube to a part of the conductive film. The conductive nonatube and the conductive film are electrically connected to each other by the conductive deposit.

Abstract: The present invention realizes a probe with a high resolution, high rigidity and high bending elasticity which can be used in a scanning probe microscope and makes it possible to pick up images of surface atoms with a high resolution. Also, a high-precision input-output probe which can be used in high-density magnetic information processing devices is also realized.

Abstract: A method for sharpening a nanotube including the steps of: connecting the base end portion of a nanotube to an electrode with the tip end portion of the nanotube protruded from the electrode; connecting the tip end portion of the nanotube to another electrode; applying a voltage between the electrodes so as to cause an electric current to flow in the middle portion of the nanotube which is located between the two electrodes; evaporating constituent atoms of the nanotube layer by layer from a evaporation starting region, which is located in the middle region of the nanotube (and can be a crystal defect region, or a curved portion), by the heat generated by the electric current, thus reducing the diameter of the evaporation starting region; and cutting the evaporation starting region that has the reduced diameter, thus forming a sharpened end on the nanotube.

Abstract: A scanning type microscope that captures substance information of the surface of a specimen by the tip end of a nanotube probe needle fastened to a cantilever, in which an organic gas is decomposed by a focused ion beam in a focused ion beam apparatus, and the nanotube is bonded to the cantilever with a deposit of the decomposed component thus produced. With this probe, the quality of the nanotube probe needle can be improved by removing an unnecessary deposit adhering to the nanotube tip end portion using a ion beam, by cutting an unnecessary part of the nanotube in order to control length of the probe needle and by injecting ions into the tip end portion of the nanotube.

Abstract: An electroconductive container that stores a nanotube product, including a container body and a cover that opens and closes the container body in which both container body and cover are made of an electroconductive material. An electroconductive fixing member can by provided in the bottom of the container for holding a nanotube product in an immovable fashion.

Abstract: A nanotube length control method involving a nanotube and a discharge needle so that the nanotube with its base end portion fastened to a holder and its tip end portion caused to protrude is set so as for its tip end to face the tip end of the discharge needle. A voltage is applied across the nanotube and the discharge needle so that an electrical discharge is caused to occur between the tip end of the nanotube and the tip end of the discharge needle, thus cutting down the tip end of the nanotube by this discharge, and it is possible to control the length of the tip end portion of the nanotube.

Abstract: A cantilever for a vertical scanning type microscope that obtains substance information of a surface of a specimen by a tip end of a nanotube probe needle fastened to the cantilever, in which the cantilever has a fixing region to which a base end portion of a nanotube serving as a probe needle is fastened, and a height direction of the fixing region is set to be substantially perpendicular to a mean surface of the specimen when the cantilever is disposed in a measuring state with respect to the mean surface of the specimen; and the base end portion of the nanotube is bonded in the height direction of the fixing region.

Abstract: To provide nanotweezers and a nanomanipulator which allow great miniaturization of the component and are capable of gripping various types of nano-substances such as insulators, semiconductors and conductors and of gripping nano-substances of various shapes. Electrostatic nanotweezers 2 are characterized in that the nanotweezers 2 are comprised of a plurality of nanotubes whose base end portions are fastened to a holder 6 so that the nanotubes protrude from the holder 6, coating films which insulate and cover the surfaces of the nanotubes, and lead wires 10, 10 which are connected to two of the nanotubes 8, 9; and the tip ends of the two nanotubes are freely opened and closed by means of an electrostatic attractive force generated by applying a voltage across these lead wires.

Abstract: To provide nanotweezers and a nanomanipulator which allow great miniaturization of the component and are capable of gripping various types of nano-substances such as insulators, semiconductors and conductors and of gripping nano-substances of various shapes.

Abstract: To provide nanotweezers and a nanomanipulator which allow great miniaturization of the component and are capable of gripping various types of nano-substances such as insulators, semiconductors and conductors and of gripping nano-substances of various shapes.

Abstract: A method for sharpening a nanotube including the steps of: connecting the base end portion of a nanotube to an electrode with the tip end portion of the nanotube protruded from the electrode; connecting the tip end portion of the nanotube to another electrode; applying a voltage between the electrodes so as to cause an electric current to flow in the middle portion of the nanotube which is located between the two electrodes; evaporating constituent atoms of the nanotube layer by layer from a evaporation starting region, which is located in the middle region of the nanotube (and can be a crystal defect region, or a curved portion), by the heat generated by the electric current, thus reducing the diameter of the evaporation starting region; and cutting the evaporation starting region that has the reduced diameter, thus forming a sharpened end on the nanotube.

Abstract: The present invention realizes a probe with a high resolution, high rigidity and high bending elasticity which can be used in a scanning probe microscope and makes it possible to pick up images of surface atoms with a high resolution. Also, a high-precision input-output probe which can be used in high-density magnetic information processing devices is also realized.

Abstract: The fusion-welded nanotube surface signal probe of the present invention is constructed from a nanotube, a holder which holds the nanotube, a fusion-welded part fastening a base end portion of the nanotube to a surface of the holder by fusion-welding, a tip end portion of the nanotube being caused to protrude from the holder; and the tip end portion is used as a probe needle so as to scan surface signals. This fusion-welded nanotube surface signal probe can be used as a probe in AFM (Atomic Force Microscope), STM (Scanning Tunneling Microscope), other SPM (Scanning Probe icroscope) and so on.