Patents by Inventor Seizi Nishizawa

Seizi Nishizawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10718708
    Abstract: An object is to provide a technique that can evaluate biological tissues such as cartilage tissue and regenerated tissues such as regenerated cartilage. A method for observing a dynamic physical property of a biological tissue according to the present invention is that a biological tissue is irradiated with a pulsed light having a wavelength of a far-infrared wavelength region modulated into circular polarized lights by applying bias voltages to a radiation means (3) having an antenna electrode films of orthogonal (2)-axis structure with phases shifted using high-voltage high-speed modulation means (13), and dynamic physical property of the biological tissue is observed on the basis of a spectrum obtained by vibration optical activity spectroscopy.
    Type: Grant
    Filed: April 4, 2017
    Date of Patent: July 21, 2020
    Assignees: ADVANCED BIO-SPECTROSCOPY CO., LTD, THE UNIVERSITY OF TOKYO
    Inventors: Takashi Ushida, Katsuko Furukawa, Seizi Nishizawa
  • Publication number: 20190128804
    Abstract: Biological tissues such as cartilage tissue and regenerated tissues such as regenerated cartilage are evaluated. Provided is a method for observing a dynamic physical property of a biological tissue by irradiating the biological tissue with a pulsed light having a wavelength of a far-infrared wavelength region to observe the dynamic physical property of the biological tissue using vibrational optical activity spectroscopy. When a sample which is the biological tissue is irradiated with a pulsed light, the biological tissue is vibrated. A relaxation time is obtained on the basis of a vibrational circular dichroism spectrum and/or a polarization spectroscopy spectrum which are/is obtained from a time-series signal of a reflected pulsed light reflected by the biological tissue or a transmitted pulsed light transmitted through the biological tissue.
    Type: Application
    Filed: April 20, 2017
    Publication date: May 2, 2019
    Applicants: ADVANCED BIO-SPECTROSCOPY CO., LTD, THE UNIVERSITY OF TOKYO
    Inventors: Takashi USHIDA, Katsuko FURUKAWA, Seizi NISHIZAWA
  • Publication number: 20190128803
    Abstract: An object is to provide a technique that can evaluate biological tissues such as cartilage tissue and regenerated tissues such as regenerated cartilage. A method for observing a dynamic physical property of a biological tissue according to the present invention is that a biological tissue is irradiated with a pulsed light having a wavelength of a far-infrared wavelength region modulated into circular polarized lights by applying bias voltages to a radiation means (3) having an antenna electrode films of orthogonal (2)-axis structure with phases shifted using high-voltage high-speed modulation means (13), and dynamic physical property of the biological tissue is observed on the basis of a spectrum obtained by vibration optical activity spectroscopy.
    Type: Application
    Filed: April 4, 2017
    Publication date: May 2, 2019
    Applicants: ADVANCED BIO-SPECTROSCOPY CO., LTD, THE UNIVERSITY OF TOKYO
    Inventors: Takashi USHIDA, Katsuko FURUKAWA, Seizi NISHIZAWA
  • Patent number: 7705311
    Abstract: A time-domain pulsed spectroscopy apparatus which has a pulsed laser light source; a splitting unit to split pulsed laser light; a pulsed-light emitting unit; a detector; a sample holder; and a sample-unit entrance and exit optical systems; wherein the time-domain pulsed spectroscopy apparatus further comprises: at least one optical-path-length varying unit for setting a photometric range; at least one optical delay unit for the wave form signal measurement; and, at least one gate member to pass or block the pulsed light to a reflector.
    Type: Grant
    Filed: February 13, 2009
    Date of Patent: April 27, 2010
    Assignees: Japan Science and Technology Agency, Seizi Nishizawa
    Inventors: Seizi Nishizawa, Toshiyuki Iwamoto
  • Patent number: 7615749
    Abstract: There is provided an infrared light emitting device that is capable of polarizing emission light without causing loss of the emission light and having a simple configuration. Included are a photoconductive layer 22 which generates optical carriers upon being irradiated with pulsed excitation light; a pair of first antenna electrodes 21a for emitting infrared light, which are formed on the photoconductive layer 22 with a gap 32 disposed between tips thereof; a pair of second antenna electrodes 21b for emitting infrared light, which are formed on the photoconductive layer 22 and which are disposed with the gap 32 between tips thereof and having an angle with respect to the first antenna electrodes 21a; and a control unit for independently applying voltages to the first antenna electrodes 21a and the second antenna electrodes 21b.
    Type: Grant
    Filed: September 27, 2005
    Date of Patent: November 10, 2009
    Assignees: Japan Science and Technology Agency
    Inventors: Seizi Nishizawa, Toshiyuki Iwamoto
  • Publication number: 20090152469
    Abstract: A time-domain pulsed spectroscopy apparatus which has a pulsed laser light source; a splitting unit to split pulsed laser light; a pulsed-light emitting unit; a detector; a sample holder; and a sample-unit entrance and exit optical systems; wherein the time-domain pulsed spectroscopy apparatus further comprises: at least one optical-path-length varying unit for setting a photometric range; at least one optical delay unit for the wave form signal measurement; and, at least one gate member to pass or block the pulsed light to a reflector.
    Type: Application
    Filed: February 13, 2009
    Publication date: June 18, 2009
    Inventors: Seizi Nishizawa, Toshiyuki Iwamoto
  • Patent number: 7507966
    Abstract: A time-domain pulsed spectroscopy apparatus which has a pulsed laser light source; a splitting unit to split pulsed laser light; a pulsed-light emitting unit; a detector; a sample holder; and a sample-unit entrance and exit optical systems; wherein the time-domain pulsed spectroscopy apparatus further comprises: at least one optical-path-length varying unit for setting a photometric range; at least one optical delay unit for the wave form signal measurement; and, at least one gate member to pass or block the pulsed light to a reflector.
    Type: Grant
    Filed: August 19, 2004
    Date of Patent: March 24, 2009
    Assignees: Japan Science and Technology Agency, Seizi Nishizawa
    Inventors: Seizi Nishizawa, Toshiyuki Iwamoto
  • Publication number: 20070194253
    Abstract: There is provided an infrared light emitting device that is capable of polarizing emission light without causing loss of the emission light and having a simple configuration. Included are a photoconductive layer 22 which generates optical carriers upon being irradiated with pulsed excitation light; a pair of first antenna electrodes 21a for emitting infrared light, which are formed on the photoconductive layer 22 with a gap 32 disposed between tips thereof; a pair of second antenna electrodes 21b for emitting infrared light, which are formed on the photoconductive layer 22 and which are disposed with the gap 32 between tips thereof and having an angle with respect to the first antenna electrodes 21a; and a control unit for independently applying voltages to the first antenna electrodes 21a and the second antenna electrodes 21b.
    Type: Application
    Filed: September 27, 2005
    Publication date: August 23, 2007
    Inventors: Seizi Nishizawa, Toshiyuki Iwamoto
  • Publication number: 20060278830
    Abstract: It is an object to provide a time-domain pulsed spectroscopy apparatus in which time-domain pulsed spectroscopy of multiple samples, states thereof, and so on can be carried out easily and in a short period of time.
    Type: Application
    Filed: August 19, 2004
    Publication date: December 14, 2006
    Inventors: Seizi Nishizawa, Toshiyuki Iwamoto
  • Patent number: 5371596
    Abstract: An apparatus for measuring the thickness of a semiconductor layer includes a light source emitting light; an interferometer producing modulated interference light by modulating the light from the light source; an optical system including a light transmission member for introducing the modulated interference light into a measurement sample including at least one film on a substrate; a light detecting element for detecting the modulated interference light reflected from the film and producing an output signal in response; an extracting element for extracting a film interference component having a waveform from the output signal; and an element for calculating the thickness of the film from the waveform of the output signal component. The light detecting element includes a plurality of photodetectors having respective photometric wavenumber ranges that overlap.
    Type: Grant
    Filed: March 8, 1993
    Date of Patent: December 6, 1994
    Assignees: JASCO Corporation, Mitsubishi Denki Kabushiki Kaisha
    Inventors: Ryo Hattori, Seizi Nishizawa, Tokuji Takahashi, Ryoichi Fukasawa
  • Patent number: 5227861
    Abstract: An apparatus for and a method of evaluating a multilayer thin film of the present invention. An interference light beam in a predetermined wave number region is projected as a parallel beam onto a multilayer thin film sample and the interference light beam reflected by the sample is detected to find an interferogram. The interferogram is subject to Fourier transform, filtering and reverse Fourier transform so that a spatialgram is provided. Thereby the variation in incident angle of the light beam incident on the sample and in incident surface is reduced, and the spatialgram can be provided with accurate information of the multilayer thin film.
    Type: Grant
    Filed: September 24, 1990
    Date of Patent: July 13, 1993
    Assignees: Mitsubishi Denki Kabushiki Kaisha, Jasco Corporation
    Inventors: Seizi Nishizawa, Ryoichi Fukazawa, Tokuzi Takahashi, Ryo Hattori
  • Patent number: 4575246
    Abstract: A continuous drive type Michelson interferometer system for use in Fourier spectroscopy, having a main Michelson interferometer for obtaining the interferogram of a sample, an auxiliary Michelson interferometer for detecting the moving speed of a movable mirror of said main Michelson interferometer, and a control section for controlling the driving speed of said movable mirror. In said control section, the AC output signal of a photodetector is converted into a voltage corresponding to the frequency of the signal, said voltage is compared with a preset voltage by a voltage difference detection means, the phase of said AC output of said photodetector is compared with a phase of a reference signal by a phase comparison means, and said driving speed is controlled by both the outputs of said voltage difference detection means and said phase comparison means.
    Type: Grant
    Filed: March 5, 1984
    Date of Patent: March 11, 1986
    Assignee: Japan Spectroscopic Co., Ltd.
    Inventors: Seizi Nishizawa, Kikuo Shirawachi