Patents by Inventor Semin Kwon

Semin Kwon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10823779
    Abstract: A substrate manufacturing apparatus includes a test apparatus including a test handler module for performing a test process on a substrate. The test handler module may include a conveyor unit to transfer a substrate, a handler unit for performing a test process on the substrate, and a transfer unit for transferring the substrate between the conveyor unit and the handler unit. The conveyor unit may include a feed conveyor and a discharge conveyor spaced apart from the feed conveyor.
    Type: Grant
    Filed: April 27, 2018
    Date of Patent: November 3, 2020
    Assignees: Samsung Electronics Co., Ltd., Semes Co., Ltd.
    Inventors: Youngchul Lee, Semin Kwon, JinHwan Lee, Jea-Muk Oh, Kyungsook Lee, Nam-Hong Lee
  • Publication number: 20180246164
    Abstract: A substrate manufacturing apparatus includes a test apparatus including a test handler module for performing a test process on a substrate. The test handler module may include a conveyor unit to transfer a substrate, a handler unit for performing a test process on the substrate, and a transfer unit for transferring the substrate between the conveyor unit and the handler unit. The conveyor unit may include a feed conveyor and a discharge conveyor spaced apart from the feed conveyor.
    Type: Application
    Filed: April 27, 2018
    Publication date: August 30, 2018
    Applicant: Semes Co. , Ltd.
    Inventors: Youngchul Lee, Semin Kwon, JinHwan Lee, Jea-Muk Oh, Kyungsook Lee, Nam-Hong Lee
  • Patent number: 9995787
    Abstract: A substrate manufacturing apparatus includes a test apparatus including a test handler module for performing a test process on a substrate. The test handler module may include a conveyor unit to transfer a substrate, a handler unit for performing a test process on the substrate, and a transfer unit for transferring the substrate between the conveyor unit and the handler unit. The conveyor unit may include a feed conveyor and a discharge conveyor spaced apart from the feed conveyor.
    Type: Grant
    Filed: February 4, 2016
    Date of Patent: June 12, 2018
    Assignees: Samsung Electronics Co., Ltd., Semes Co., Ltd.
    Inventors: Youngchul Lee, Semin Kwon, JinHwan Lee, Jea-Muk Oh, Kyungsook Lee, Nam-Hong Lee
  • Publication number: 20160154054
    Abstract: A substrate manufacturing apparatus includes a test apparatus including a test handler module for performing a test process on a substrate. The test handler module may include a conveyor unit to transfer a substrate, a handler unit for performing a test process on the substrate, and a transfer unit for transferring the substrate between the conveyor unit and the handler unit. The conveyor unit may include a feed conveyor and a discharge conveyor spaced apart from the feed conveyor.
    Type: Application
    Filed: February 4, 2016
    Publication date: June 2, 2016
    Inventors: Youngchul Lee, Semin Kwon, JinHwan Lee, Jea-Muk Oh, Kyungsook Lee, Nam-Hong Lee
  • Patent number: 9285416
    Abstract: A substrate manufacturing apparatus includes a test apparatus including a test handler module for performing a test process on a substrate. The test handler module may include a conveyor unit to transfer a substrate, a handler unit for performing a test process on the substrate, and a transfer unit for transferring the substrate between the conveyor unit and the handler unit. The conveyor unit may include a feed conveyor and a discharge conveyor spaced apart from the feed conveyor.
    Type: Grant
    Filed: March 13, 2013
    Date of Patent: March 15, 2016
    Assignees: Samsung Electronics Co., Ltd., Semes Co., Ltd.
    Inventors: Youngchul Lee, Semin Kwon, JinHwan Lee, Jea-Muk Oh, Kyungsook Lee, Nam-Hong Lee
  • Publication number: 20130257471
    Abstract: A substrate manufacturing apparatus includes a test apparatus including a test handler module for performing a test process on a substrate. The test handler module may include a conveyor unit to transfer a substrate, a handler unit for performing a test process on the substrate, and a transfer unit for transferring the substrate between the conveyor unit and the handler unit. The conveyor unit may include a feed conveyor and a discharge conveyor spaced apart from the feed conveyor.
    Type: Application
    Filed: March 13, 2013
    Publication date: October 3, 2013
    Inventors: Youngchul Lee, Semin Kwon, JinHwan Lee, Jea-Muk Oh, Kyungsook Lee, Nam-Hong Lee