Abstract: A method of sharing in use an impedance matching circuit of a memory circuit to perform an initial calibration and a full time refresh mode calibration includes supplying power to the memory circuit, utilizing the impedance matching circuit to perform the initial calibration on the memory circuit, the memory circuit exiting the initial calibration, the memory circuit entering a driving mode, the memory circuit exiting the driving mode every a predetermined interval, utilizing the impedance matching circuit to perform the full time refresh mode calibration on the memory circuit according to a refresh command, an output voltage detection circuit determining a level of an output voltage of the memory circuit, and performing a corresponding operation according to a determination result generated by the output voltage detection circuit.

Abstract: A memory includes a determination circuit, a plurality of refresh counters, and a plurality of banks. The determination circuit receives a refresh command. The plurality of refresh counters are coupled to the determination circuit. Each refresh counter of the plurality of refresh counters corresponds to one bank of the plurality of banks. The determination circuit detects whether a first bank of the plurality of banks is enabled or a number counted by a first refresh counter of the plurality of refresh counters corresponding to the first bank is equal to a predetermined value. Then, the determination circuit optionally refreshes one bank of the plurality of banks according to a detection result. Thus, the memory still refreshes an idle bank according to a refresh command even if the plurality of banks are not all idle.

Abstract: A device for increasing chip testing efficiency includes a pattern generator, a reading unit, a logic operation circuit, and a judgment unit. The pattern generator is used for writing a logic voltage to each bank of a memory chip. The reading unit is used for reading logic voltages stored in all memory cells of each bank. The logic operation circuit is used for executing a first logic operation on the logic voltages stored in all memory cells of each bank to generate a plurality of first logic operation results corresponding to each bank, and executing a second logic operation on the plurality of first logic operation results to generate a second logic operation result corresponding to the memory chip. The judgment unit determines whether the memory chip passes the test according to the second logic operation result.

Abstract: An input buffer system with a dual-input buffer switching function includes a first input buffer, a second input buffer, and a multiplexer. The first input buffer is used for outputting a first signal when an input signal is at a logic-high voltage, and the first input buffer is turned off when the input signal is at a logic-low voltage. The second input buffer is used for outputting a second signal when the input signal is at the logic-low voltage. The multiplexer is coupled to the first input buffer and the second input buffer for outputting the first signal or the second signal according to a self refresh signal.

Abstract: A method of sharing in use an impedance matching circuit of a memory circuit to perform an initial calibration and a full time refresh mode calibration includes supplying power to the memory circuit, utilizing the impedance matching circuit to perform the initial calibration on the memory circuit, the memory circuit exiting the initial calibration, the memory circuit entering a driving mode, the memory circuit exiting the driving mode every a predetermined interval, utilizing the impedance matching circuit to perform the full time refresh mode calibration on the memory circuit according to a refresh command, an output voltage detection circuit determining a level of an output voltage of the memory circuit, and performing a corresponding operation according to a determination result generated by the output voltage detection circuit.

Abstract: A memory includes a determination circuit, a plurality of refresh counters, and a plurality of banks. The determination circuit receives a refresh command. The plurality of refresh counters are coupled to the determination circuit. Each refresh counter of the plurality of refresh counters corresponds to one bank of the plurality of banks. The determination circuit detects whether a first bank of the plurality of banks is enabled or a number counted by a first refresh counter of the plurality of refresh counters corresponding to the first bank is equal to a predetermined value. Then, the determination circuit optionally refreshes one bank of the plurality of banks according to a detection result. Thus, the memory still refreshes an idle bank according to a refresh command even if the plurality of banks are not all idle.

Abstract: A device for increasing chip testing efficiency includes a pattern generator, a reading unit, a logic operation circuit, and a judgment unit. The pattern generator is used for writing a logic voltage to each bank of a memory chip. The reading unit is used for reading logic voltages stored in all memory cells of each bank. The logic operation circuit is used for executing a first logic operation on the logic voltages stored in all memory cells of each bank to generate a plurality of first logic operation results corresponding to each bank, and executing a second logic operation on the plurality of first logic operation results to generate a second logic operation result corresponding to the memory chip. The judgment unit determines whether the memory chip passes the test according to the second logic operation result.

Abstract: An input buffer system with a dual-input buffer switching function includes a first input buffer, a second input buffer, and a multiplexer. The first input buffer is used for outputting a first signal when an input signal is at a logic-high voltage, and the first input buffer is turned off when the input signal is at a logic-low voltage. The second input buffer is used for outputting a second signal when the input signal is at the logic-low voltage. The multiplexer is coupled to the first input buffer and the second input buffer for outputting the first signal or the second signal according to a self refresh signal.

Abstract: Output circuit with reduced overshoot includes input end, output end, a circuit composed of PMOS and NMOS, rising and falling edge trigger bias circuits. The rising and falling edge trigger bias circuits output biasing voltages to the output end for clamping the voltage of the output signals respectively according to the rising edge and the falling edge of the input signal. In this way, the overshoot of the output signal is reduced.

Abstract: Output circuit with reduced overshoot includes input end, output end, a circuit composed of PMOS and NMOS, rising and falling edge trigger bias circuits. The rising and falling edge trigger bias circuits output biasing voltages to the output end for clamping the voltage of the output signals respectively according to the rising edge and the falling edge of the input signal. In this way, the overshoot of the output signal is reduced.