Patents by Inventor Seng J. Edward

Seng J. Edward has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8762095
    Abstract: A tool to aid a test engineer in creating a concurrent test plan. The tool may quickly map test system resources to specific pins to satisfy the requirements of a concurrent test. The tool may project test time when such a mapping is possible. When a mapping is not possible, the tool may inform its user, including making suggestions of additional resources that could allow the test system to perform the test or suggestions for other variations in input parameters that would allow a mapping. The tool employs an assignment process in which groups of associated pins are identified, along with associated resource requirements for each group. Groups of test system resources that collectively fulfill a higher level requirement are identified and the assignment is made by mapping resource sets to resource groups, using ordering and matching heuristics to reduce processing time.
    Type: Grant
    Filed: May 4, 2011
    Date of Patent: June 24, 2014
    Assignee: Teradyne, Inc.
    Inventors: Bethany Van Wagenen, Seng J. Edward
  • Publication number: 20110275170
    Abstract: A tool to aid a test engineer in creating a concurrent test plan. The tool may quickly map test system resources to specific pins to satisfy the requirements of a concurrent test. The tool may project test time when such a mapping is possible. When a mapping is not possible, the tool may inform its user, including making suggestions of additional resources that could allow the test system to perform the test or suggestions for other variations in input parameters that would allow a mapping. The tool employs an assignment process in which groups of associated pins are identified, along with associated resource requirements for each group. Groups of test system resources that collectively fulfill a higher level requirement are identified and the assignment is made by mapping resource sets to resource groups, using ordering and matching heuristics to reduce processing time.
    Type: Application
    Filed: May 4, 2011
    Publication date: November 10, 2011
    Applicant: Teradyne, Inc.
    Inventors: Bethany Van Wagenen, Seng J. Edward