Abstract: A manufacturing method of a semiconductor device, includes forming a plurality of main gate sacrificial patterns spaced apart from each other on a stacked structure of subgate sacrificial patterns and semiconductor patterns; forming a first insulating layer between main gate sacrificial patterns; removing the main gate sacrificial patterns; removing the subgate sacrificial patterns; forming a main gate dummy pattern in a space from which the main gate sacrificial patterns are removed; forming a plurality of subgate dummy patterns in a space from which the subgate sacrificial patterns are removed; forming a recess under a space where the first insulating layer is removed; forming a source/drain pattern within the recess; forming a second insulating layer on the source/drain pattern; removing the main gate dummy pattern and the subgate dummy patterns; and forming a gate electrode in a space where the main gate dummy pattern and the subgate dummy patterns are removed.

Abstract: A semiconductor device includes a substrate including an active region extending in a first direction, a gate structure intersecting the active region on the substrate and extending in a second direction, where the active region includes a recessed region at at least one side of the gate structure, a plurality of channel layers on the active region, spaced apart from each other in a third direction that is substantially perpendicular to an upper surface of the substrate, and at least partially surrounded by the gate structure and a source/drain region in the recessed region of the active region and connected to the plurality of channel layers.

Abstract: An integrated circuit device includes a fin-type active region on a substrate; at least one nanosheet having a bottom surface facing the fin top; a gate line on the fin-type active region; and a source/drain region on the fin-type active region, adjacent to the gate line, and in contact with the at least one nanosheet, wherein the source/drain region includes a lower main body layer and an upper main body layer, a top surface of the lower main body layer includes a lower facet declining toward the substrate as it extends in a direction from the at least one nanosheet to a center of the source/drain region, and the upper main body layer includes a bottom surface contacting the lower facet and a top surface having an upper facet. With respect to a vertical cross section, the lower facet extends along a corresponding first line and the upper facet extends along a second line that intersects the first line.

Abstract: The present invention provides a pharmaceutical composition for preventing and treating central nervous system (CNS) diseases, diabetes and complications thereof, the pharmaceutical composition comprising, as an active ingredient, a benzimidazole or benzoxazole derivative having the structure of chemical formula 1 or a pharmaceutically acceptable salt thereof. The benzimidazole or benzoxazole derivative used as an active ingredient in the pharmaceutical composition of the present invention can, via an Nrf2 activation mechanism caused by the Keap1-Nrf2-ARE pathway and via an activation pathway of glutamate transporters such as GLT-1/EAAT and GLAST, inhibit oxidative damage in the central nervous system and the pancreas while inducing production of an antioxidant such as glutathione, thereby maximizing the effect of treating central nervous system diseases, diabetes and complications thereof.