Patents by Inventor Seok-Chan YOON

Seok-Chan YOON has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220381695
    Abstract: A focus scan type imaging device for imaging a target object in a sample that induces aberration proposed. The device includes: a light source unit for emitting a beam; an optical interferometer for splitting the beam emitted from the light source into a sample wave and a reference wave, and providing an interference wave formed by interference between a reflection wave that is the sample wave reflected from the sample and the reference wave; a camera module for imaging the interference wave; a scanning mirror disposed on an optical path of the sample wave of the optical interferometer and configured to reflect the sample wave to cause the sample wave to scan the sample; a wavefront shaping modulator disposed on the optical path of the sample wave of the optical interferometer; and an imaging controller configured to operate in a phase map calculation mode and in an imaging mode.
    Type: Application
    Filed: October 12, 2020
    Publication date: December 1, 2022
    Applicants: Korea University Research and Business Foundation, INSTITUTE FOR BASIC SCIENCE
    Inventors: Won-Shik CHOI, Seok-Chan YOON, Ho-Jun LEE
  • Patent number: 11085875
    Abstract: The present invention relates to a high-speed imaging system for measuring a target object within a sample, comprising: a light source emitting a plane wave; an angle-adjustment mirror adjusting an angle of the plane wave emitted from the light source; an optical interferometer dividing the plane wave whose angle was adjusted by the angle-adjustment mirror into a reference wave and a sample wave and forming an interference wave between the reference wave reflected from a reference mirror and the sample wave reflected from the target object; a camera module obtaining the interference wave, and an imaging controller controlling the angle-adjustment mirror to adjust the angle of the plane wave sequentially, forming a time-gated reflection matrix by using the interference waves obtained by the camera module in accordance with each angle of the plane wave, and imaging the target object based on the time-gated reflection matrix.
    Type: Grant
    Filed: October 3, 2019
    Date of Patent: August 10, 2021
    Assignees: Korea University Research and Business Foundation, Institute For Basic Science
    Inventors: Won-Shik Choi, Moon-Seok Kim, Yong-Hyeon Jo, Seok-Chan Yoon
  • Publication number: 20200110026
    Abstract: The present invention relates to a high-speed imaging system for measuring a target object within a sample, comprising: a light source emitting a plane wave; an angle-adjustment mirror adjusting an angle of the plane wave emitted from the light source; an optical interferometer dividing the plane wave whose angle was adjusted by the angle-adjustment mirror into a reference wave and a sample wave and forming an interference wave between the reference wave reflected from a reference mirror and the sample wave reflected from the target object; a camera module obtaining the interference wave, and an imaging controller controlling the angle-adjustment mirror to adjust the angle of the plane wave sequentially, forming a time-gated reflection matrix by using the interference waves obtained by the camera module in accordance with each angle of the plane wave, and imaging the target object based on the time-gated reflection matrix.
    Type: Application
    Filed: October 3, 2019
    Publication date: April 9, 2020
    Applicants: Korea University Research and Business Foundation, Institute For Basic Science
    Inventors: Won-Shik CHOI, Moon-Seok KIM, Yong-Hyeon JO, Seok-Chan YOON