Abstract: The present invention relates to a transformer and a circuit board comprising same. One embodiment of the transformer according to the present invention comprises: a core part comprising a core lower portion and a core upper portion disposed on the core lower portion; and a coil part which comprises a first coil and a second coil and of which at least a portion is disposed in the core part, wherein the core lower portion has a closed region which overlaps the core upper portion in a first direction from the core lower portion toward the core upper portion, and an open region which extends from the closed region in a second direction perpendicular to the first direction and which is exposed to the outside of the closed area.

Abstract: The present disclosure relates to an organic light emitting diode and an organic light emitting device including the same. The organic light emitting diode includes a first electrode; a second electrode facing the first electrode; and a first blue emitting material layer including a first compound and a second compound and positioned between the first and second electrodes, wherein the first compound is represented by Formula 1, and the second compound is represented by Formula 3. According to an aspect of the present disclosure, it is allowed to provide an OLED and an organic light emitting device having high emitting efficiency and/or improved lifespan.

Abstract: The disclosure relates to a tobacco material including a flavor material and a method of preparing the tobacco material. The tobacco material may have a core-shell structure in which a core includes a first tobacco mixture and a flavor material and is surrounded by a shell including a second tobacco mixture, such that the aerosol generating article including the tobacco material generates a characteristic flavor.

Abstract: An embodiment of the present disclosure discloses tobacco material including: a center portion including a flavor material; and an outer portion including a tobacco mixture, wherein the outer portion surrounds the center portion.

Abstract: An inker test apparatus is provided for use with a wafer probe station. The test apparatus includes a plurality of movable parts which allow positioning of the inker adjacent the wafer area. Sensors are provided adjacent the inker solenoid and the inkline of the inker. A control panel has keys for selecting parameters of the solenoid operation number and time and for displaying the tests results. Also, a controller responds to the input parameters from the control panel to produce a corresponding solenoid drive signal. The controller also detects malfunction of the solenoid and inkline based on the output signals from the solenoid sensor and inkline sensor. Further, a power supply is provided for generating suitable operating voltage for the inker solenoid.