Abstract: Sorting handler for a burn-in tester including two DC testing parts and two unloading buffers on opposite sides of the burn-in board at a working post in a line with a main working line respectively, one pair of a loader part for supplying new devices and an unloader part for receiving tested good devices on each of side parts of a body, so that two insert/remove pickers carry out a work continuously in which two insert/remove pickers move along the main working line in both directions with reference to the burn-in board, to remove the devices from the burn-in board, and insert devices to be tested in the space in turn, thereby improving a test productivity per a unit time period.

Abstract: An exposure mask and a method for divisional exposure are provided to advantageously reduce or eliminate stitch defects in displays. In one embodiment, an exposure mask comprises a masking panel and a slit for selectively transmitting light from a light source, the slit including a taper portion such that an area proximate the taper portion transmits less than full light intensity onto a substrate to be masked. In one example, the area proximate the taper portion is bounded between an inner corner and an outer corner of the taper portion. In a further example, the area proximate the taper portion transmits substantially one-half the light intensity onto the substrate to be masked. A method of divisional exposure utilizing the advantageous exposure mask is also disclosed.

Abstract: A device for seating a semiconductor device in a semiconductor test handler is provided. The device includes a plate having a plurality of device seating members each for seating the semiconductor device. The device also includes a latch rotatably mounted to one side of the device seating member for pressing down or freeing the semiconductor device seated on the device seating member. A latch operating means for causing the latch to press down the semiconductor device when the semiconductor device is seated on the device seating member is also included. The provided device also releases the pressing down action when the semiconductor device is seated on the device seating member and when the semiconductor device is taken away from the device seating member, thereby seating the semiconductor device on the device seating device accurately and positively.

Abstract: A device for seating a semiconductor device in a semiconductor test handler is provided. The device includes a plate having a plurality of device seating members each for seating the semiconductor device. The device also includes a latch rotatably mounted to one side of the device seating member for pressing down or freeing the semiconductor device seated on the device seating member. A latch operating means for causing the latch to press down the semiconductor device when the semiconductor device is seated on the device seating member is also included. The provided device also releases the pressing down action when the semiconductor device is seated on the device seating member and when the semiconductor device is taken away from the device seating member, thereby seating the semiconductor device on the device seating device accurately and positively.

Abstract: A coating apparatus includes support for supporting a mother substrate including unit substrates, a coater for coating the unit substrate with photosensitive materials, a detector for detecting foreign matters, a remover for removing the foreign matters from the unit substrate, and a controller for controlling the coater, detector, and remover. The coater includes a body containing the photosensitive materials, and inlet and outlet portions for inputting and outputting the photosensitive materials to/from the body. A width of the outlet portion is the same as that of the unit substrate. The detector is positioned at front of the coater to detect the foreign matters before the coating process. The remover removes the foreign matters. The coater discharges the photosensitive material only onto the unit substrate. Discharging of the photosensitive material is interrupted when the foreign matters are found.

Abstract: A picture decoding synchronizing circuit and a picture decoding synchronizing method are provided. When the decoding synchronization is controlled in units of a picture, in a variable length decoder using the transferred PTS and DTS information, the value obtained by adding the previous DTS to an offset is determined to be the DTS value of the current picture, if errors are generated in the transferred PTS and DTS, considering the errors of the transferred bit stream. If no errors are generated in the PTS or DTS, then the transferred PTS and DTS are determined to be the DTS value of the current picture. By controlling the picture decoding using the determined DTS value, the bit buffer does not underflow or overflow and the decoded data is displayed naturally on a screen.

Abstract: A device test handler and a method for operating the same provide a significant reduction of the picking up and placing time periods, and reduce possible damage to the devices being tested. Devices and methods embodying the invention facilitate room temperature and high temperature testing within one device test handler to maximize testing efficiency. A test handler embodying the invention may include a pre-heater for pre-heating the devices on a loading shuttle as the loading shuttle passes to a test chamber. An indexing device in a test chamber of the device is used for successively transferring the devices from a loading shuttle to the test socket, and tested devices from the test socket to an unloading shuttle. Heat supply means may be provided for supplying a high temperature heat to the test chamber when the devices are required to be tested in a hot state.

Abstract: A device test handler and a method for operating the same provide a significant reduction of the picking up and placing time periods, and reduce possible damage to the devices being tested. Devices and methods embodying the invention facilitate room temperature and high temperature testing within one device test handler to maximize testing efficiency. A test handler embodying the invention may include a pre-heater for pre-heating the devices on a loading shuttle as the loading shuttle passes to a test chamber. An indexing device in a test chamber of the device is used for successively transferring the devices from a loading shuttle to the test socket, and tested devices from the test socket to an unloading shuttle. Heat supply means may be provided for supplying a high temperature heat to the test chamber when the devices are required to be tested in a hot state.

Abstract: A caption data processing circuit in a decoder is provided for decoding a transport stream (TS). The caption data processing circuit extracts presentation information and caption data from an input transport stream and generates a control signal when the caption data of a one-picture unit has been extracted. A caption decoding portion of the circuit decodes the extracted caption data in response to the control signal. A buffer in the circuit stores the decoded caption data so that the presentation timing of the decoded caption data may be controlled based on the presentation information. As a result, the presentation timing of the picture data and caption data are exactly synchronized, thereby displaying the picture along with its correct caption.

Abstract: A die bonding apparatus includes: a lead frame supply station for accommodating a plurality of lead frames; a frame transferring device for picking up the lead frame and transferring it to an Ag epoxy application table or to a traveling rail; a frame fixing station for fixing the lead frame to the Ag epoxy application table by suction power of a vacuum pump or moving it back and forth through actuation of a motor; an Ag epoxy supply station for ejecting a predetermined amount of Ag epoxy through a nozzle to the top surface of the lead frame; a moving device for moving the lead frame forward on the traveling rail; a preheating station for receiving the lead frame into a magazine and preheating it; a wafer placement station for transferring wafers sequentially supplied from a wafer supply station to a predetermined location through rotation; a die transferring device for picking up a die and transferring it to a work site for die bonding; a die bonding station for precisely bonding the die to a site where a tap

Abstract: A decoding apparatus decodes symbols and header data obtained by variable length decoding. The decoding apparatus comprises a data distributor (10) for receiving the symbols and alternately outputting blocks of the symbols via two output terminals. A header analyzer (50) receives the header data, analyzes the received header data and outputs parameters relating to restoration of the symbols. DC component decoding unit (40) detects symbols relating to DC coefficients of an intra-macroblock among the symbols output from the data distributor (10), and restores the DC coefficients of the intra-macroblock using the detected symbols and the parameters supplied from the header analyzer (50).

Abstract: A system clock recovery apparatus in an MPEG decoding system for decoding a received system coded stream in the form of a transport stream or a program stream, includes a depacketizer for depacketizing the received stream and outputting decoding time data for representing a video decoding time, a system clock value and a video elementary stream, a detector for detecting a delayed value of a video buffering verifier (VBV) using the video elementary stream of the depacketizer and generating a detection indication signal for indicating a detected point of time of the delayed value of the VBV, and a system clock generator for varying the current system clock and the current system time clock according to the decoding time data and the system clock value of the depacketizer and the VBV delayed value and the detection indication signal of the detector.

Abstract: An apparatus for decoding a video bitstream according to the MPEG standard. The decoder restores variable length decoded data at a processing speed required by high-speed systems, such as a high definition television system.

Abstract: A buffer occupancy control method is provided in order to properly control a buffer occupancy of a decoder. The intial time delay indicated in data received by the buffer is extended and the capacity of the buffer is expanded according to the additional amount of data inserted during the extended initial time delay, thereby preventing the buffer from overflowing and underflowing. In particular, when a bitstream encoded with a frame rate of 24 Hz is decoded according to a display field frequency of 60 Hz, excellent images can be regenerated without requiring additional components.

Abstract: When a data error is generated in a macroblock in a Bidirectionally-predictive coded picture (i.e., a B-picture), error concealment is performed on the macroblock. In the situation where the macroblock in the row just above and in the same column as the error-generated macroblock is an intra macroblock, the intra macroblock cannot be used to provide a motion vector for use in error concealment. In such a case, a method is provided to obtain a motion vector for the error-generated macroblock by taking the arithmetic average of the motion vectors of the macroblocks which are on each side of the macroblock just above the error-generated macroblock and in the same column. Error concealment by motion compensation is performed with respect to the corresponding macroblock in the same position in the B-picture which is either forward or backward in time sequence. Choice of whether the forward or backward B-picture is to be used is made adaptively, based upon whether a scene change is determined to have occurred.