Abstract: An electric-axle device for a commercial vehicle that can minimize the frequency of using a main brake when braking, may include a first clutch device disposed between a motor and a differential casing to transmit or block power, a second clutch device disposed between the differential casing and a disc, an electromagnetic brake applying a braking force to the disc, and that can increase a coasting distance and improve energy efficiency and durability of the motor by disengaging the first clutch device and the second clutch device such that kinetic energy, which is transmitted to the motor from an axle shaft, is blocked as if a neutral gear of a transmission is engaged, when the vehicle coasts.

Abstract: A non-volatile memory device including a substrate including a first area and a second area, a mold structure on the substrate, the mold structure including gate electrodes and mold insulating films alternately stacked on each other in a stepwise manner, an interlayer insulating film covering the mold structure, a channel structure on the first area, the channel structure extending through the mold structure and connected to the gate electrodes, and a through-contact on the second area and extending through the interlayer insulating film, the through-contact including a first portion in a first trench and a second portion in a second trench, the first portion including a liner film along a sidewall and a bottom surface of the first trench and a filling film on the liner film, wherein the filling film being a multi-grain conductive material, and the second portion being a single grain conductive material, may be provided.

Abstract: An electric-axle device for a commercial vehicle that can minimize the frequency of using a main brake when braking, may include a first clutch device disposed between a motor and a differential casing to transmit or block power, a second clutch device disposed between the differential casing and a disc, an electromagnetic brake applying a braking force to the disc, and that can increase a coasting distance and improve energy efficiency and durability of the motor by disengaging the first clutch device and the second clutch device such that kinetic energy, which is transmitted to the motor from an axle shaft, is blocked as if a neutral gear of a transmission is engaged, when the vehicle coasts.

Abstract: A Semiconductor device and method for fabricating the same are provided. The method includes forming a trench in a substrate, forming a lower gate metal using a first gas, the lower gate metal burying at least a portion of the trench, forming a barrier metal on the lower gate metal, on the barrier metal, forming an upper gate metal using a second gas different from the first gas and forming a capping film on the gate metal, the capping film filling the trench.

Abstract: A Semiconductor device and method for fabricating the same are provided. The method includes forming a trench in a substrate, forming a lower gate metal using a first gas, the lower gate metal burying at least a portion of the trench, forming a barrier metal on the lower gate metal, on the barrier metal, forming an upper gate metal using a second gas different from the first gas and forming a capping film on the gate metal, the capping film filling the trench.

Abstract: A method of forming a tungsten film including disposing a substrate inside a process chamber; performing a tungsten nucleation layer forming operation for forming a tungsten nucleation layer on the substrate, performing a first operation for forming a portion of a tungsten bulk layer on the tungsten nucleation layer by alternately supplying a tungsten-containing gas and a reducing gas into the process chamber, and performing a second operation for stopping the supply of the tungsten-containing gas and the reducing gas and removing a remaining gas in the process chamber may be provided. The first operation and the second operation may be repeated at least twice until the tungsten bulk layer reaches a desired thickness.

Abstract: A semiconductor memory device comprises a memory cell array including a plurality of memory blocks each including a plurality of pages, wherein each of the plurality of pages includes at least one flag cell indicating whether data is in a corresponding page, and a peripheral circuit configured to read data of flag cells of a selected memory block in response to an erase request and to omit an erase operation on the selected memory block based on the data of the flag cells.

Abstract: A semiconductor memory device comprises a memory cell array including a plurality of memory blocks each including a plurality of pages, wherein each of the plurality of pages includes at least one flag cell indicating whether data is in a corresponding page, and a peripheral circuit configured to read data of flag cells of a selected memory block in response to an erase request and to omit an erase operation on the selected memory block based on the data of the flag cells.

Abstract: A semiconductor memory device comprises a memory cell array including a plurality of memory blocks each including a plurality of pages, wherein each of the plurality of pages includes at least one flag cell indicating whether data is in a corresponding page, and a peripheral circuit configured to read data of flag cells of a selected memory block in response to an erase request and to omit an erase operation on the selected memory block based on the data of the flag cells.

Abstract: A semiconductor memory device comprises a memory cell array including a plurality of memory blocks each including a plurality of pages, wherein each of the plurality of pages includes at least one flag cell indicating whether data is in a corresponding page, and a peripheral circuit configured to read data of flag cells of a selected memory block in response to an erase request and to omit an erase operation on the selected memory block based on the data of the flag cells.

Abstract: A method of operating a memory system includes classifying numbers of total error bits into a plurality of ranges, assigning a plurality of data to the plurality of ranges, respectively, counting a number of detected error bits for a memory cell block, and storing a selected one of the plurality of data in at least one spare cell when the number of the detected error bits is within one of the ranges that corresponds to the selected data.

Abstract: A non-volatile memory device comprises a voltage supplier comprising memory cells in which the voltage supplier supplies a positive set voltage to a bulk of a memory cell array at the time of a read operation of the memory cells and a controller for controlling the voltage supplier to set and supply a bulk voltage depending on a number of erase/program cycles of the memory cell array.

Abstract: A memory device has memory cells that are Multi-Level Cells (MLCs). A memory cell array includes a plurality of cell strings, each string provided between a bit line and a common source line, wherein a positive voltage is applied to the common source line at the time of program verification. A page buffer is configured to program the MLCs, read memory cells, and perform program verification. This program verification is performed by sequentially increasing a voltage level of a bit line select signal until the bit line select signal reaches to a voltage that is sufficient to verify a programmed state of a selected cell in the memory cell array.

Abstract: A flash memory device includes a memory cell array including a plurality of memory cells, a page buffer unit including a plurality of page buffers connected to bit lines of the memory cell array, a data line mux unit connected between the page buffer unit and a data line and configured to receive verification data through a page buffer during a verify operation. The flash memory device also includes a fail bit counter unit for counting the verification data, comparing counted fail bits and the number of ECC allowed bits, and outputting a pass or fail signal of a program operation according to the comparison result.

Abstract: Program voltages of a non-volatile memory device are controlled variably according to a program/erase operation count. The non-volatile memory device includes a program voltage supply unit for applying a program voltage to a memory cell, a program/erase count storage unit for storing a total program/erase operation count of the non-volatile memory device, a program start voltage storage unit for storing levels of program start voltages to be differently supplied according to the program/erase operation count, and a program voltage controller for controlling the program start voltage according to the program/erase operation count.

Abstract: An erase method of a memory cell array which includes at least one block having MLC is disclosed. The erase method includes shifting every threshold voltage distribution into a threshold voltage distribution having a highest level by pre-programming every cell in a block selected for erase, performing an erase operation on the pre-programmed memory block, performing a soft program and a verifying operation on the memory block, dividing the memory block into a first group and a second group when the memory block is passed, performing a verifying operation on the first group and performing a soft program and a verifying operation on the first group when the first group is not passed, and performing a verifying operation on the second group when the first group is passed and performing a soft program and a verifying operation on the second group when the second group is not passed.

Abstract: A non-volatile memory device includes planes, a control logic circuit, a high voltage generator, and a X-decoder. The planes have a plurality of memory cell blocks, respectively. The control logic circuit outputs a row address, which allows a block address to select the same memory cell blocks from different planes at substantially the same time according to an external address signal including the block address and an erase mode bit signal, and an erase instruction signal. The high voltage generator generates erase voltages for an erase operation according to the erase instruction signal. The X-decoder applies the erase voltages to memory cell blocks selected by the row address.

Abstract: A flash memory device includes a memory cell array including a plurality of memory cells, a page buffer unit including a plurality of page buffers connected to bit lines of the memory cell array, a data line mux unit connected between the page buffer unit and a data line and configured to receive verification data through a page buffer during a verify operation. The flash memory device also includes a fail bit counter unit for counting the verification data, comparing counted fail bits and the number of ECC allowed bits, and outputting a pass or fail signal of a program operation according to the comparison result.

Abstract: A threshold voltage of a non-volatile memory device is compensated by a voltage supplier and a controller. The voltage supplier supplies a set voltage to a bulk of a memory cell array, including memory cells, at the time of a read operation of the memory cells. The controller controls the voltage supplier to set and supply a bulk voltage depending on a threshold voltage change of the memory cells.