Patents by Inventor Seong Hwon Yu

Seong Hwon Yu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6906883
    Abstract: The present disclosure relates to a system for detecting a plurality of defect types on the surface of a disk in a hard disk drive. In particular, the disclosure relates to utilizing information obtained from a plurality of servo bits to determine if a sector contains a physical defect. Where such a defect is found, the sector's write gate is disabled and its burst signal data is ignored for track following purposes. In addition, large changes in PES are used to identify closure spike defects. Such defects are managed by providing a compensation signal to the read value of the PES to improve track following. Finally, high PES values are used to signal a third defect type where no other signs of defect are present. In such case, the sector is mapped as defective, but the burst signals continue to be used for track following purposes.
    Type: Grant
    Filed: September 13, 2001
    Date of Patent: June 14, 2005
    Assignee: Samsung Electronics Ltd., Co.
    Inventors: Sang Hoon Chu, Jun Seok Shim, Seong Hwon Yu, Soo Il Choi
  • Patent number: 6791778
    Abstract: An apparatus, method and computer program product for a hard disk drive defect detection system. In one embodiment, a method of detecting defects on the surface of a disk having a plurality of tracks is recited. The method comprises reading, one or more times, the servo bits for a plurality of sectors and determining a burst measure for at least one sector, where the burst measure is a function of the burst signals for the sector. This method further comprises determining a reference value, where the reference value is a function of the burst signals of the plurality of sectors, and comparing the burst measure of at least one sector to the reference value to identify a potential defect. In one embodiment, a sector is mapped as defective where its burst measure differs from the reference value by at least 5 percent.
    Type: Grant
    Filed: September 13, 2001
    Date of Patent: September 14, 2004
    Assignee: Samsung Electronics Co., Inc.
    Inventors: Sang Hoon Chu, Jun Seok Shim, Seong Hwon Yu, Soo Il Choi
  • Publication number: 20020048112
    Abstract: The present disclosure relates to a system for detecting a plurality of defect types on the surface of a disk in a hard disk drive. In particular, the disclosure relates to utilizing information obtained from a plurality of servo bits to determine if a sector contains a physical defect. Where such a defect is found, the sector's write gate is disabled and its burst signal data is ignored for track following purposes. In addition, large changes in PES are used to identify closure spike defects. Such defects are managed by providing a compensation signal to the read value of the PES to improve track following. Finally, high PES values are used to signal a third defect type where no other signs of defect are present. In such case, the sector is mapped as defective, but the burst signals continue to be used for track following purposes.
    Type: Application
    Filed: September 13, 2001
    Publication date: April 25, 2002
    Inventors: Sang Hoon Chu, Jun Seok Shim, Seong Hwon Yu, Soo Il Choi
  • Publication number: 20020048108
    Abstract: An apparatus, method and computer program product for a hard disk drive defect detection system. In one embodiment, a method of detecting defects on the surface of a disk having a plurality of tracks is recited. The method comprises reading, one or more times, the servo bits for a plurality of sectors and determining a burst measure for at least one sector, where the burst measure is a function of the burst signals for the sector. This method further comprises determining a reference value, where the reference value is a function of the burst signals of the plurality of sectors, and comparing the burst measure of at least one sector to the reference value to identify a potential defect. In one embodiment, a sector is mapped as defective where its burst measure differs from the reference value by at least 5 percent.
    Type: Application
    Filed: September 13, 2001
    Publication date: April 25, 2002
    Inventors: Sang Hoon Chu, Jun Seok Shim, Seong Hwon Yu, Soo Il Choi