Abstract: Provided is a collecting apparatus. The collecting apparatus may include: a collector collecting test data generated in a specific test space; a data server keeping the test data generated in the specific test space, and a handler of an administrator.

Abstract: An optical and copper composite terminal box can include a terminal box body, a splitter having a lead-in terminal connectable to any one of a plurality of cores included in an optical cable, and a plurality of output terminals connectable to a plurality of cables. The splitter can be provided on one side in the terminal box body. The terminal box can include a copper cable connection device which is disposed in the terminal box body adjacent to the splitter and is connectable to a copper cable forming a different signal from the optical cable.

Abstract: The present invention relates to an apparatus for puncturing a maxillary sinus, the apparatus including: a main body gripped by an operator; a probing unit detachable from the main body and configured to detect a posterior fontanelle; a surgical procedure tube which is provided in the main body and formed of an endoscope unit configured to monitor the posterior fontanelle, a puncturing unit configured to puncture the posterior fontanelle, and an irrigation tube configured to irrigate the maxillary sinus through a punctured portion of the posterior fontanelle; and an operation unit provided in the main body and configured to operate the surgical procedure tube.

Abstract: A patch cord identification inspection system includes a patch cord having first and second connectors, which are coupled to both end parts of an optical fiber cable and are detachably connected to predetermined electronic devices and in which first and second light-emitting diode (LED) modules are respectively embedded. The patch cord identification inspection system includes an identification inspector selectively slidably and detachably coupled to any one of the first and second connectors and configured to identify and inspect electrical connection states of the first and second connectors on the basis of lighting states of the first and second LED modules.

Abstract: Disclosed is a patch cord identification inspection system. The patch cord identification inspection system includes a patch cord having first and second connectors which are coupled to both end parts of an optical fiber cable and are detachably connected to predetermined electronic devices and in which first and second light-emitting diode (LED) modules are respectively embedded, and an identification inspector selectively slidably and detachably coupled to any one of the first and second connectors and configured to identify and inspect electrical connection states of the first and second connectors on the basis of lighting states of the first and second LED modules.

Abstract: The present invention relates to an apparatus for puncturing a maxillary sinus, the apparatus including: a main body gripped by an operator; a probing unit detachable from the main body and configured to detect a posterior fontanelle; a surgical procedure tube which is provided in the main body and formed of an endoscope unit configured to monitor the posterior fontanelle, a puncturing unit configured to puncture the posterior fontanelle, and an irrigation tube configured to irrigate the maxillary sinus through a punctured portion of the posterior fontanelle; and an operation unit provided in the main body and configured to operate the surgical procedure tube.

Abstract: The present invention relates to an apparatus for puncturing a maxillary sinus, the apparatus including a main body gripped by an operator and having a puncturing tube, an ultrasonic probing unit disposed in the main body and configured to detect a posterior fontanel without bones along a direction from a middle meatus to a maxillary sinus, a puncturing unit disposed in the main body, and having a needle disposed at a front end of the puncturing tube and configured to cauterize the posterior fontanel using electricity and puncture the posterior fontanel and a cautery wire configured to pass through the puncturing tube and supply electricity to the needle, an operation unit disposed in the main body and configured to move the puncturing unit toward the posterior fontanel, and an irrigation tube disposed to be fitted to the cautery wire in the puncturing tube and installed at the posterior fontanel punctured by the needle.

Abstract: An air purifier according to the present disclosure includes: a memory for storing a flow rate/pressure differential correlation graph with regard to each filter utilization state; a pressure differential sensor for measuring a pressure differential, which is a difference in pressure between the front and rear ends of the filter; and a filter replacement time management unit for determining the time to replace the filter according to a result of matching a pressure differential of the filter, which is measured by the pressure differential sensor at a preset cycle, and the flow rate of air flowing into the filter during pressure differential measurement with the flow rate/pressure differential correlation graph for each utilization state.

Abstract: A low drop-out (LDO) regulator includes a pass transistor, a feedback circuit, an error amplifier, and a compensation unit. The pass transistor is configured to regulate a power supply and output an output voltage according to a control signal. The feedback circuit is configured to generate a feedback voltage based on the output voltage. The error amplifier is configured to output a comparison signal in response to a reference voltage and the feedback voltage. The compensation circuit is configured to generate a negative capacitance in association with a first node connected to a gate electrode of the pass transistor.

Abstract: A broadband light source includes a first electrodeless lamp to generate first broadband light from plasma, a first elliptical reflector having first and second focuses, the first elliptical reflector enclosing a rear portion of the first electrodeless lamp positioned at the first focus of the first elliptical reflector such that the first broadband light is reflected from the first elliptical reflector toward a light collector as a collective light, a symmetrically curved reflector having a third focus, the symmetrically curved reflector positioned such that the third focus is coincident with one of the first and second focuses, and a laser irradiator to provide a laser beam to the first electrodeless lamp.

Abstract: There is provided a biosensor, which may measure the concentration of indoor bioaerosols through an optical sensing method of sensing ultraviolet light scattered by bioacrosols, and an air cleaner having the same. The biosensor includes a light irradiator and an ultraviolet light sensor detecting scattered ultraviolet light, from light irradiated by the light irradiator, reflected from bioaerosols. The biosensor may measure the concentration of indoor bioaerosols through the optical sensing method in real time, using a certain wavelength of ultraviolet light scattered by bioaerosols, and may allow the air cleaner to be operated under proper conditions based on a measured concentration of bioaerosols and a measured concentration of dust particles.

Abstract: An air purifier according to an embodiment of the present invention may comprise: a memory for storing a flow rate/pressure differential correlation graph with regard to each filter utilization state; a pressure differential sensor for measuring a pressure differential, which is a difference in pressure between the front and rear ends of the filter; and a filter replacement time management unit for determining the time to replace the filter according to a result of matching a pressure differential of the filter, which is measured by the pressure differential sensor at a preset cycle, and the flow rate of air flowing into the filter during pressure differential measurement with the flow rate/pressure differential correlation graph for each utilization state.

Abstract: Example embodiments relate to an apparatus and method for inspecting a substrate defect. The substrate defect inspecting apparatus includes a substrate, a light source emitting an infrared beam to the substrate, a detector detecting the infrared beam reflected from the substrate, and a defect analyzer receiving first information and second information from the detector and analyzing defects existing in the substrate. According to at least one example embodiment, the second information is acquired during a later process than the first information.

Abstract: A low drop-out (LDO) regulator includes a pass transistor, a feedback circuit, an error amplifier, and a compensation unit. The pass transistor is configured to regulate a power supply and output an output voltage according to a control signal. The feedback circuit is configured to generate a feedback voltage based on the output voltage. The error amplifier is configured to output a comparison signal in response to a reference voltage and the feedback voltage. The compensation circuit is configured to generate a negative capacitance in association with a first node connected to a gate electrode of the pass transistor.

Abstract: There is provided a biosensor, which may measure the concentration of indoor bioaerosols through an optical sensing method of sensing ultraviolet light scattered by bioaerosols, and an air cleaner having the same. The biosensor includes a light irradiator and an ultraviolet light sensor detecting scattered ultraviolet light, from light irradiated by the light irradiator, reflected from bioaerosols. The biosensor may measure the concentration of indoor bioaerosols through the optical sensing method in real time, using a certain wavelength of ultraviolet light scattered by bioaerosols, and may allow the air cleaner to be operated under proper conditions based on a measured concentration of bioaerosols and a measured concentration of dust particles.

Abstract: An overlay measuring method includes irradiating an electron beam onto a sample, including a multi-layered structure of overlapped upper and lower patterns formed thereon, to obtain an actual image of the upper and lower patterns. A first image representing the upper pattern and a second image representing the lower pattern are obtained from the actual image. A reference position for the upper and lower patterns is determined from a design image of the upper and lower patterns. A position deviation of the upper pattern with respect to the reference position in the first image and a position deviation of the lower pattern with respect to the reference position in the second image are calculated to determine an overlay between the upper pattern and the lower pattern.

Abstract: A surveillance camera with a heat map function. The surveillance camera may include a heat map generator to generate a heat map image made of graphics that show a heat distribution by accumulating traces of a moving object within the original captured image; and a heat map combiner to combine the heat map image with the original image.

Abstract: A broadband light source includes a first electrodeless lamp to generate first broadband light from plasma, a first elliptical reflector having first and second focuses, the first elliptical reflector enclosing a rear portion of the first electrodeless lamp positioned at the first focus of the first elliptical reflector such that the first broadband light is reflected from the first elliptical reflector toward a light collector as a collective light, a symmetrically curved reflector having a third focus, the symmetrically curved reflector positioned such that the third focus is coincident with one of the first and second focuses, and a laser irradiator to provide a laser beam to the first electrodeless lamp.

Abstract: Example embodiments relate to an apparatus and method for inspecting a substrate defect. The substrate defect inspecting apparatus includes a substrate, a light source emitting an infrared beam to the substrate, a detector detecting the infrared beam reflected from the substrate, and a defect analyzer receiving first information and second information from the detector and analyzing defects existing in the substrate. According to at least one example embodiment, the second information is acquired during a later process than the first information.

Abstract: An overlay measuring method includes irradiating an electron beam onto a sample, including a multi-layered structure of overlapped upper and lower patterns formed thereon, to obtain an actual image of the upper and lower patterns. A first image representing the upper pattern and a second image representing the lower pattern are obtained from the actual image. A reference position for the upper and lower patterns is determined from a design image of the upper and lower patterns. A position deviation of the upper pattern with respect to the reference position in the first image and a position deviation of the lower pattern with respect to the reference position in the second image are calculated to determine an overlay between the upper pattern and the lower pattern.