Abstract: A semiconductor memory device includes: a repair address generation unit configured to generate a repair address signal in response to a first address signal; a line choice address generation unit configured to generate a line choice address signal by combining the first address signal and the repair address signal according to a determination as to whether the repair address signal is to be used; and a cell line decoding unit configured to select one of a normal cell region and a redundancy cell region according to the determination, and select one of a plurality of local cell lines provided in the selected cell region in response to the line choice address signal.

Abstract: A word line block select circuit includes a dummy repair logic unit including a dummy logic circuit to output a first control signal and having a delay path for a repair address decision, and a word line activation unit for activating a word line in response to the first control signal and an active command signal.

Abstract: A semiconductor memory device includes: a repair address generation unit configured to generate a repair address signal in response to a first address signal; a line choice address generation unit configured to generate a line choice address signal by combining the first address signal and the repair address signal according to a determination as to whether the repair address signal is to be used; and a cell line decoding unit configured to select one of a normal cell region and a redundancy cell region according to the determination, and select one of a plurality of local cell lines provided in the selected cell region in response to the line choice address signal.

Abstract: A word line block select circuit includes a dummy repair logic unit including a dummy logic circuit to output a first control signal and having a delay path for a repair address decision, and a word line activation unit for activating a word line in response to the first control signal and an active command signal.

Abstract: A word line block select circuit includes a dummy repair logic unit including a dummy logic circuit to output a first control signal and having a delay path for a repair address decision, and a word line activation unit for activating a word line in response to the first control signal and an active command signal.

Abstract: A precharge circuit in a semiconductor memory apparatus includes a burst setting unit for controlling a state of a burst setting signal using delay elements in response to a burst start signal, wherein the delay elements operate in synchronization with a clock signal when the burst setting signal is deactivated, a burst termination unit for generating a burst termination signal in response to the burst setting signal, a precharge control unit for generating a read precharge control signal and a write precharge control signal in response to the burst termination signal, and a precharge signal generating unit for generating a precharge signal using the read precharge control signal or the write precharge control signal according to a read or write operation.

Abstract: A precharge circuit for a semiconductor memory apparatus includes a preliminary precharge signal generating unit that extracts read or write command including a precharge command to enable a preliminary precharge signal, and feedbacks the enabled preliminary precharge signal, to disable the preliminary precharge signal; and a precharge signal generating unit that outputs the preliminary precharge signal as a precharge signal, after the lapse of a delayed time corresponding to the read or write command.

Abstract: A precharge circuit in a semiconductor memory apparatus includes a burst setting unit for controlling a state of a burst setting signal using delay elements in response to a burst start signal, wherein the delay elements operate in synchronization with a clock signal when the burst setting signal is deactivated, a burst termination unit for generating a burst termination signal in response to the burst setting signal, a precharge control unit for generating a read precharge control signal and a write precharge control signal in response to the burst termination signal, and a precharge signal generating unit for generating a precharge signal using the read precharge control signal or the write precharge control signal according to a read or write operation.

Abstract: A word line block select circuit includes a dummy repair logic unit including a dummy logic circuit to output a first control signal and having a delay path for a repair address decision, and a word line activation unit for activating a word line in response to the first control signal and an active command signal.

Abstract: A precharge circuit for a semiconductor memory apparatus includes a preliminary precharge signal generating unit that extracts read or write command including a precharge command to enable a preliminary precharge signal, and feedbacks the enabled preliminary precharge signal, to disable the preliminary precharge signal; and a precharge signal generating unit that outputs the preliminary precharge signal as a precharge signal, after the lapse of a delayed time corresponding to the read or write command.

Abstract: Provided are a semiconductor memory device and a driving method thereof, which can reduce power consumption and operation delay time by preventing an overlapped driving of word lines. The pseudo SRAM includes: an address input unit for receiving an address through a pin and outputting the received address as an internal address; a transition detecting unit for detecting a transition of the internal address; a word line (WL) driving signal generating unit for generating a WL driving signal in response to an output signal of the transition detecting unit; and a control signal generating unit, in response to a pin select signal, for generating a first control signal for controlling the address input unit to output only an valid address as the internal address, and a second control signal for controlling the WL driving signal generating unit to activate the WL driving signal.

Abstract: Provided are a semiconductor memory device and a driving method thereof, which can reduce power consumption and operation delay time by preventing an overlapped driving of word lines. The pseudo SRAM includes: an address input unit for receiving an address through a pin and outputting the received address as an internal address; a transition detecting unit for detecting a transition of the internal address; a word line (WL) driving signal generating unit for generating a WL driving signal in response to an output signal of the transition detecting unit; and a control signal generating unit, in response to a pin select signal, for generating a first control signal for controlling the address ID input unit to output only an valid address as the internal address, and a second control signal for controlling the WL driving signal generating unit to activate the WL driving signal.

Abstract: A semiconductor memory device includes a masking unit for masking the generation of an undesired column access signal by using a write data masking signal, wherein the masking unit includes an address receiver for receiving control signals including a write data masking signal, a bank address column signal and a read/write strobe signal and a column address decoder for outputting a column access signal.

Abstract: A semiconductor memory device includes a masking unit for masking the generation of an undesired column access signal by using a write data masking signal, wherein the masking unit includes an address receiver for receiving control signals including a write data masking signal, a bank address column signal and a read/write strobe signal and a column address decoder for outputting a column access signal.