Patents by Inventor Seppo Vaatainen

Seppo Vaatainen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Quality factor
    Patent number: 7324712
    Abstract: The present invention concerns the discrimination of good measurement results measured by a computer vision system from bad results. By the method of the invention, values calculated from the observation vectors of several measuring devices can be discriminated into good and bad values by using a quality factor. The quality factor is calculated from the parameters of an error ellipsoid. The error ellipsoid is formed using the calculated value and the observation vectors. If the value calculated from the error ellipsoid parameters exceeds a threshold value that has been input, then the measurement result is rejected.
    Type: Grant
    Filed: November 25, 2002
    Date of Patent: January 29, 2008
    Assignee: Mapvision Oy Ltd.
    Inventors: Esa Leikas, Henrik Haggrén, Seppo Väätäinen
  • Quality factor
    Publication number: 20050013510
    Abstract: The present invention concerns the discrimination of good measurement results measured by a computer vision system from bad results. By the method of the invention, values calculated from the observation vectors of several measuring devices can be discriminated into good and bad values by using a quality factor. The quality factor is calculated from the parameters of an error ellipsoid. The error ellipsoid is formed using the calculated value and the observation vectors. If the value calculated from the error ellipsoid parameters exceeds a threshold value that has been input, then the measurement result is rejected.
    Type: Application
    Filed: November 25, 2002
    Publication date: January 20, 2005
    Inventors: Esa Leikas, Henrik Haggren, Seppo Vaatainen