Abstract: An encoding device and a decoding device use linear and nonlinear codes for encoding and decoding system data for a storage device. The encoding device includes a linear encoder for encoding first data to generate encoded data and a nonlinear transformer for transforming the encoded data with second data to generate output data. The first data includes data on a physical address corresponding to a logical address. The second data includes the logical address and a timestamp value indicating a version of map data mapping between the logical address and the physical address.

Abstract: Techniques for injecting memory read errors may include obtaining an error injection profile from a test library. A defense level in the defense hierarchy can be selected for execution according to the probabilities in the error injection profile. One or more errors can be injected into read operations of the storage device according to the defense-level read retry vector of the selected defense level, and a defense algorithm of the selected defense level is executed to recover read data of the read operations.

Abstract: Techniques for injecting memory read errors may include obtaining an error injection profile from a test library. A defense level in the defense hierarchy can be selected for execution according to the probabilities in the error injection profile. One or more errors can be injected into read operations of the storage device according to the defense-level read retry vector of the selected defense level, and a defense algorithm of the selected defense level is executed to recover read data of the read operations.

Abstract: An encoding device and a decoding device use linear and nonlinear codes for encoding and decoding system data for a storage device. The encoding device includes a linear encoder for encoding first data to generate encoded data and a nonlinear transformer for transforming the encoded data with second data to generate output data. The first data includes data on a physical address corresponding to a logical address. The second data includes the logical address and a timestamp value indicating a version of map data mapping between the logical address and the physical address.

Abstract: An encoding device and a decoding device use linear and nonlinear codes for encoding and decoding system data for a storage device. The encoding device includes a linear encoder for encoding first data to generate encoded data and a nonlinear transformer for transforming the encoded data with second data to generate output data. The first data includes data on a physical address corresponding to a logical address. The second data includes the logical address and a timestamp value indicating a version of map data mapping between the logical address and the physical address.

Abstract: A simulation system is provided for memory systems. The simulation system includes: a test device suitable for generating a test command; and a virtual device suitable for configuring at least one of multiple subsystems and a storage, each subsystem including firmware, configured for a firmware development stage, and performing a test on corresponding firmware of each configured subsystem with the storage using the test command.

Abstract: An encoding device and a decoding device use linear and nonlinear codes for encoding and decoding system data for a storage device. The encoding device includes a linear encoder for encoding first data to generate encoded data and a nonlinear transformer for transforming the encoded data with second data to generate output data. The first data includes data on a physical address corresponding to a logical address. The second data includes the logical address and a timestamp value indicating a version of map data mapping between the logical address and the physical address.

Abstract: A simulation system is provided for memory systems. The simulation system includes: a test device suitable for generating a test command; and a virtual device suitable for configuring at least one of multiple subsystems and a storage, each subsystem including firmware, configured for a firmware development stage, and performing a test on corresponding firmware of each configured subsystem with the storage using the test command.