Patents by Inventor Sergey Gorelick

Sergey Gorelick has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11735404
    Abstract: The invention relates to a method, a device and a system for the treatment of biological frozen samples using plasma focused ion beams (FIB). The samples can then be used for mass spectrometry (MS), genomics, such as gene sequencing analysis or next generation sequencing (NGS) analysis, and proteomics. The present invention particularly relates to a method of treatment of at least one biological sample. This method is particularly used for high performance microscopy, proteomics analytics, sequencing, such as NGS etc. According to the present invention the method comprises the steps of providing at least one biological sample in frozen form. The milling treats at least one part of the sample by a plasma ion beam comprising at least one of an O+ and/or a Xe+ plasma.
    Type: Grant
    Filed: September 10, 2020
    Date of Patent: August 22, 2023
    Assignee: FEI Company
    Inventors: Alex De Marco, Sergey Gorelick, Chad Rue, Joseph Christian, Kenny Mani, Steven Randolph, Matthias Langhorst
  • Publication number: 20210066056
    Abstract: The invention relates to a method, a device and a system for the treatment of biological frozen samples using plasma focused ion beams (FIB). The samples can then be used for mass spectrometry (MS), genomics, such as gene sequencing analysis or next generation sequencing (NGS) analysis, and proteomics. The present invention particularly relates to a method of treatment of at least one biological sample. This method is particularly used for high performance microscopy, proteomics analytics, sequencing, such as NGS etc. According to the present invention the method comprises the steps of providing at least one biological sample in frozen form. The milling treats at least one part of the sample by a plasma ion beam comprising at least one of an O+ and/or a Xe+ plasma.
    Type: Application
    Filed: September 10, 2020
    Publication date: March 4, 2021
    Inventors: Alex DE MARCO, Sergey GORELICK, Chad RUE, Joseph CHRISTIAN, Kenny MANI, Steven RANDOLPH, Matthias LANGHORST
  • Publication number: 20190206664
    Abstract: The invention relates to a method, a device and a system for the treatment of biological frozen samples using plasma focused ion beams (FIB). The samples can then be used for mass spectrometry (MS), genomics, such as gene sequencing analysis or next generation sequencing (NGS) analysis, and proteomics. The present invention particularly relates to a method of treatment of at least one biological sample. This method is particularly used for high performance microscopy, proteomics analytics, sequencing, such as NGS etc. According to the present invention the method comprises the steps of providing at least one biological sample in frozen form. The milling treats at least one part of the sample by a plasma ion beam comprising at least one of an O+ and/or a Xe+ plasma.
    Type: Application
    Filed: December 19, 2018
    Publication date: July 4, 2019
    Inventors: Alex DE MARCO, Sergey GORELICK, Chad RUE, Joseph CHRISTIAN, Kenny MANI, Steven RANDOLPH, Matthias LANGHORST
  • Patent number: 9685251
    Abstract: The present invention relates to a method for producing an image of a target using radiation and a diffraction grating and apparatus for x-ray imaging. The method comprises directing a beam of radiation to the target to produce a modified beam through interaction with the target, directing the modified beam to an diffraction grating to produce an interference pattern, detecting the interference pattern using a detector, and forming an image of the target using the interference pattern measured. According to the invention, the diffraction grating is modified n the plane of the grating during the imaging so that at least two interference patterns are detected using the detector different configurations of the diffraction grating. Further, the image of the target using the at least two interference patterns measured. The invention provides a simple configuration, less radiation exposure and/or better image quality then conventional imaging methods.
    Type: Grant
    Filed: October 28, 2013
    Date of Patent: June 20, 2017
    Assignee: Teknologian tutkimuskeskus VTT Oy
    Inventor: Sergey Gorelick
  • Publication number: 20150294749
    Abstract: The present invention relates to a method for producing an image of a target using radiation and a diffraction grating and apparatus for x-ray imaging. The method comprises directing a beam of radiation to the target to produce a modified beam through interaction with the target, directing the modified beam to an diffraction grating to produce an interference pattern, detecting the interference pattern using a detector, and forming an image of the target using the interference pattern measured. According to the invention, the diffraction grating is modified n the plane of the grating during the imaging so that at least two interference patterns are detected using the detector different configurations of the diffraction grating. Further, the image of the target using the at least two interference patterns measured. The invention provides a simple configuration, less radiation exposure and/or better image quality then conventional imaging methods.
    Type: Application
    Filed: October 28, 2013
    Publication date: October 15, 2015
    Inventor: Sergey Gorelick