Patents by Inventor Sergey Igorevich Stepanov

Sergey Igorevich Stepanov has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7906411
    Abstract: Deposited layers are advantageously obtained by utilizing a specific hydride vapor phase epitaxy deposition procedure. In this procedure, a vertical growth cell structure with extended diffusion layer, a homogenising diaphragm, sidewall purging gases, anal independent gas and substrate heaters is used for the deposition of III-V and VI compound semiconductors. This gas flow is uniformly mixed through the extended diffusion layer and directed so that it contacts the full surface of the substrate to produce high quality and uniform films. Exemplary of such gas flow configurations are the positioning of a substrate at a distance from the gas outlets to allow the extended diffusion and a diaphragm placed in a short distance above the substrate to minimize the impact of the convection effect and to improve the uniformity. This symmetrical configuration allows easy scale up from a single wafer to multi-wafer system.
    Type: Grant
    Filed: June 27, 2005
    Date of Patent: March 15, 2011
    Assignee: Nanogan Limited
    Inventors: Wang Nang Wang, Sergey Igorevich Stepanov
  • Publication number: 20080132040
    Abstract: Deposited layers are advantageously obtained by utilizing a specific hydride vapour phase epitaxy deposition procedure. In this procedure, a vertical growth cell structure with extended diffusion layer, a homogenising diaphragm, sidewall purging gases, anal independent gas and substrate heaters is used for the deposition of III-V and VI compound semiconductors. This gas flow is uniformly mixed through the extended diffusion layer and directed so that it contacts the full surface of the substrate to produce high quality and uniform films. Exemplary of such gas flow configurations are the positioning of a substrate at a distance from the gas outlets to allow the extended diffusion and a diaphragm placed in a short distance above the substrate to minimise the impact of the convection effect and to improve the uniformity. This symmetrical configuration allows easy scale up from a single wafer to multi-wafer system.
    Type: Application
    Filed: June 27, 2005
    Publication date: June 5, 2008
    Inventors: Wang Nang Wang, Sergey Igorevich Stepanov
  • Patent number: 7011711
    Abstract: A chemical vapor deposition reactor for depositing a thin film on at least a substrate through a reaction between a vertical input reagent gas flow and the at least a substrate is provided, in which a vertical output reagent gas flow is produced after the reaction. The reactor includes a vertical tube, at least a reaction chamber located inside the vertical tube, an input flow baffle located on the at least a reaction chamber, and at least a gas exit installed on the at least a reaction chamber for exhausting the vertical input reagent gas flow and the vertical output reagent gas flow. In addition, the substrate is located at the bottom of the at least a reaction chamber. The provided reactors allow the achievement of more efficient heating process, lower gas consumption and higher growth uniformity than the conventional reactors.
    Type: Grant
    Filed: May 23, 2003
    Date of Patent: March 14, 2006
    Inventors: Yury Georgievich Shreter, Yury Toomasovich Rebane, Ruslan Ivanovich Gorbunov, Sergey Igorevich Stepanov, Vladislav Evgenievich Bougrov, Vladimir Nikolaev, Maxim Nikolaevich Blashenkov, Alexander Nikolaevich Andreev, Stephen Sen-Tien Lee
  • Publication number: 20040129213
    Abstract: A chemical vapor deposition reactor for depositing a thin film on at least a substrate through a reaction between a vertical input reagent gas flow and the at least a substrate is provided, in which a vertical output reagent gas flow is produced after the reaction. The reactor includes a vertical tube, at least a reaction chamber located inside the vertical tube, an input flow baffle located on the at least a reaction chamber, and at least a gas exit installed on the at least a reaction chamber for exhausting the vertical input reagent gas flow and the vertical output reagent gas flow. In addition, the substrate is located at the bottom of the at least a reaction chamber. The provided reactors allow the achievement of more efficient heating process, lower gas consumption and higher growth uniformity than the conventional reactors.
    Type: Application
    Filed: May 23, 2003
    Publication date: July 8, 2004
    Inventors: Yury Georgievich Shreter, Yury Toomasovich Rebane, Ruslan Ivanovich Gorbunov, Sergey Igorevich Stepanov, Vladislav Evgenievich Bougrov, Vladimir Nikolaev, Maxim Nikolaevich Blashenkov, Alexander Nikolaevich Andreev, Stephen Sen-Tien Lee