Patents by Inventor Sergey Kizunov

Sergey Kizunov has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Parameter space reduction for device testing
    Patent number: 11789074
    Abstract: Described herein are systems, methods, and other techniques for identifying redundant parameters and reducing parameters for testing a device. A set of test values and limits for a set of parameters are received. A set of simulated test values for the set of parameters are determined based on one or more probabilistic representations for the set of parameters. The one or more probabilistic representations are constructed based on the set of test values. A set of cumulative probabilities of passing for the set of parameters are calculated based on the set of simulated test values and the limits. A reduced set of parameters are determined from the set of parameters based on the set of cumulative probabilities of passing. The reduced set of parameters are deployed for testing the device.
    Type: Grant
    Filed: October 13, 2021
    Date of Patent: October 17, 2023
    Assignee: NATIONAL INSTRUMENTS CORPORATION
    Inventors: James C. Nagle, Stephen Thung, Sergey Kizunov, Shaul Teplinsky
  • PARAMETER SPACE REDUCTION FOR DEVICE TESTING
    Publication number: 20230114555
    Abstract: Described herein are systems, methods, and other techniques for identifying redundant parameters and reducing parameters for testing a device. A set of test values and limits for a set of parameters are received. A set of simulated test values for the set of parameters are determined based on one or more probabilistic representations for the set of parameters. The one or more probabilistic representations are constructed based on the set of test values. A set of cumulative probabilities of passing for the set of parameters are calculated based on the set of simulated test values and the limits. A reduced set of parameters are determined from the set of parameters based on the set of cumulative probabilities of passing. The reduced set of parameters are deployed for testing the device.
    Type: Application
    Filed: October 13, 2021
    Publication date: April 13, 2023
    Applicant: National Instruments Corporation
    Inventors: James C. Nagle, Stephen Thung, Sergey Kizunov, Shaul Teplinsky