Abstract: A method for correcting distortion in a coherent electron diffraction imaging (CEDI) image induced by a projection lens makes use of a known secondary material that is imaged together with a sample of interest. Reflections generated from the secondary material are located in the image, and these observed reflections are used to approximate a beam center location. Using a known lattice structure of the secondary material, Friedel pairs are located in the image and unit cell vectors are identified. Predicted positions for each of the secondary material reflections are then determined, and the position differences between the observed reflections and the predicted reflections are used to construct a relocation function applicable to the overall image. The relocation function is then used to adjust the position of image components so as to correct for the distortion.

Abstract: A laser-line-generating system generates and process a laser light to illuminate a capillary array. The laser-line-generating system includes a laser-light source, focusing optics, a first optical scanner, and a second optical scanner. The laser-light source outputs a first laser light. The focusing optics receives the first laser light and reduces a beam width of the first laser light. The first optical scanner receives the first laser light and output a first optical-scanner-outputted light by varying an angle of outputted light along a first dimension. The second optical scanner receives the first optical-scanner-outputted light and outputs a second optical-scanner-outputted light by varying an angle of outputted light along a second dimension. The second optical-scanner-outputted light includes a line with dimensional components in both the first dimension and the second dimension.