Patents by Inventor Sergey Subach

Sergey Subach has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for examining a sample
    Patent number: 8347410
    Abstract: Disclosed is a method for examining a sample using a scanning tunneling microscope, wherein before or during image recording, a contrast agent is applied to at least one location on the tip of the scanning tunneling microscope and/or on the sample, which is part of the tunneling contact during the image recording, while a temperature less than or equal to the condensation temperature of the contrast agent is set at this location. A corresponding scanning tunneling microscope is disclosed.
    Type: Grant
    Filed: November 7, 2008
    Date of Patent: January 1, 2013
    Assignee: Forschungszentrum Juelich GmbH
    Inventors: Ruslan Temirov, Sergey Subach, Frank Stefan Tautz
  • METHOD FOR EXAMINING A SAMPLE
    Publication number: 20100263097
    Abstract: Disclosed is a method for examining a sample using a scanning tunneling microscope, wherein before or during image recording, a contrast agent is applied to at least one location on the tip of the scanning tunneling microscope and/or on the sample, which is part of the tunneling contact during the image recording, while a temperature less than or equal to the condensation temperature of the contrast agent is set at this location. A corresponding scanning tunneling microscope is disclosed.
    Type: Application
    Filed: November 7, 2008
    Publication date: October 14, 2010
    Inventors: Ruslan Temirov, Sergey Subach, Frank Stefan Tautz