Abstract: System and method for measurement of optical parameters and characterization of multiport optical devices constituted by process control systems, one or more sources of optical test signal (11) (tunable laser source), optical circuit including optical fiber and several other optical components arranged so as to constitute an interferometric optical arrangement, optical connectors, optoeletronic interfaces, photodetectors, analogical electronic; circuits, digital electronic circuits for digital signal processing and electronic circuits for data acquisition, the test and reference optical signals traversing paths with any lengths, that can be identical or distinct, the optical signal traversing at least one of said paths of interferometer being phase- and/or frequency-modulated.

Abstract: An optical device comprises an optical fibre device having wavelength-dependent optical characteristics mounted on a bimorph element operable to bend in response to an electrical control signal, so that the wavelength-dependent optical characteristics of the optical fibre device vary in response to bending of the bimorph element.