Patents by Inventor Sergio Casillas

Sergio Casillas has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for testing an IC device based on relative timing of test signals
    Patent number: 7624323
    Abstract: An apparatus for testing an IC device includes a test signal generator for generating a predefined sequence of test signals that are input to the IC device. A timing skew monitor is provided for monitoring the test signals input in the IC device and a signal output from the IC device for a predetermined time period, and creating an array indicating an execution or a nonexecution of signal timing combinations of one of the test signals relative to at least one of the other test signals within the predetermined time period by the IC device. A determination as to whether the desired signal timing combinations of the test signals have been executed by the IC device is made by an operator.
    Type: Grant
    Filed: October 31, 2006
    Date of Patent: November 24, 2009
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventors: Sergio Casillas, Jr., Bruce LaVigne
  • Method and apparatus for testing an IC device based on relative timing of test signals
    Publication number: 20080104471
    Abstract: An apparatus for testing an IC device includes a test signal generator for generating a predefined sequence of test signals that are input to the IC device. A timing skew monitor is provided for monitoring the test signals input in the IC device and a signal output from the IC device for a predetermined time period, and creating an array indicating an execution or a nonexecution of signal timing combinations of one of the test signals relative to at least one of the other test signals within the predetermined time period by the IC device. A determination as to whether the desired signal timing combinations of the test signals have been executed by the IC device is made by an operator.
    Type: Application
    Filed: October 31, 2006
    Publication date: May 1, 2008
    Inventors: Sergio Casillas, Bruce LaVigne