Patents by Inventor Serguei Ilchenko

Serguei Ilchenko has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Tandem time-of-flight mass spectrometer
    Patent number: 7825374
    Abstract: A tandem mass spectrometer includes a linear time-of-flight mass analyzer and curved field reflectron mass analyzer. The curved-field reflectron mass analyzer is disposed at an end of the linear time-of-flight mass analyzer such that ions having a plurality of ion masses formed in the linear time-of-flight analyzer such that ions having a plurality of ion masses formed in the linear time-of-flight analyzer enter the curved-field reflectron mass analyzer. The tandem mass spectrometer also includes a mass selection gate disposed between the time-of-flight mass analyzer and the curved-field reflectron mass analyzer. The mass selection gate selects an ion mass from the plurality of ion masses. Furthermore, the tandem mass spectrometer also includes a dissociating component located in a path of the ions formed in the linear time-of-flight analyzer. The dissociating component causes dissociation of the ions into a plurality of ion fragments.
    Type: Grant
    Filed: February 23, 2004
    Date of Patent: November 2, 2010
    Assignee: The Johns Hopkins University
    Inventors: Robert James Cotter, Benjamin D. Gardner, Robert D. English, Serguei A. Ilchenko
  • Tandem time-of-flight mass spectrometer
    Publication number: 20070034794
    Abstract: A tandem mass spectrometer includes a linear time-of-flight mass analyzer and curved field reflectron mass analyzer. The curved-field reflectron mass analyzer is disposed at an end of the linear time-of-flight mass analyzer such that ions having a plurality of ion masses formed in the linear time-of-flight analyzer such that ions having a plurality of ion masses formed in the linear time-of-flight analyzer enter the curved-field reflectron mass analyzer. The tandem mass spectrometer also includes a mass selection gate disposed between the time-of-flight mass analyzer and the curved-field reflectron mass analyzer. The mass selection gate selects an ion mass from the plurality of ion masses. Furthermore, the tandem mass spectrometer also includes a dissociating component located in a path of the ions formed in the linear time-of-flight analyzer. The dissociating component causes dissociation of the ions into a plurality of ion fragments.
    Type: Application
    Filed: February 23, 2004
    Publication date: February 15, 2007
    Applicant: THE JOHNS HOPKINS UNIVERSITY
    Inventors: Robert Cotter, Benjamin Gardner, Robert English, Serguei Ilchenko